ADP1053ACPZ-R7 datasheet(8/84 Pages) AD

8 / 84 page

ADP1053

Data Sheet

Rev. A | Page 8 of 84

Parameter

Test Conditions/Comments

Min

Typ

Max

Unit

SERIAL BUS TIMING

See Figure 3

Clock Frequency

100

400

kHz

Glitch Immunity, tSW

Bus Free Time, tBUF

1.3

μs

Start Setup Time, tSU;STA

0.6

μs

Stop Setup Time, tSU;STO

0.6

μs

Start Hold Time, tHD;STA

0.6

μs

SCL Low Time, tLOW

0.6

μs

SCL High Time, tHIGH

0.6

μs

SCL, SDA Rise Time, tR

SCL, SDA Fall Time, tF

Data Setup Time, tSU;DAT

100

Data Hold Time, tHD;DAT

Read

125

Write

300

EEPROM

EEPROM Update Time

Time from update command to

EEPROM update completed (TJ = 25°C)

Reliability

Endurance1

TJ = 85°C

10,000

Cycles

TJ = 125°C

1000

Cycles

Data Retention2

TJ = 85°C

Years

TJ = 125°C

Years

1 Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. Endurance conditions are subject to change

pending EEPROM qualification.

2 Retention lifetime equivalent at junction temperature (TJ) = 125°C as per JEDEC Standard 22, Method A117. The derated lifetime is subject to change pending EEPROM

qualification.

SCL

SDA

tBUF

tHD;STA

tHD;DAT

tHIGH

tSU;DAT

tHD;STA

tSU;STA

tSU;STO

tLOW

Figure 3. Serial Bus Timing Diagram

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