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GD32H757ZMT7 Folha de dados(PDF) 104 Page - GigaDevice Semiconductor (Beijing) Inc. |
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GD32H757ZMT7 Folha de dados(HTML) 104 Page - GigaDevice Semiconductor (Beijing) Inc. |
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104 / 151 page ![]() GD32H757xx Datasheet 103 Table 4-25. PLLUSBHS0/1 characteristics(3) Symbol Parameter Conditions Min Typ Max Unit fPLLIN(1) PLL input clock frequency — 4 — 30 MHz fPLLOUT(1) PLL output clock frequency — — 480 — MHz fVCO(1) PLL VCO output clock frequency — — 480 — MHz tLOCK(1) PLL lock time — — 100 150 μs IDDA(2) Current consumption on VDDA — — 1.7 — mA JitterPLL Cycle to cycle Jitter(rms) System clock — 40 — ps Cycle to cycle Jitter (peak to peak) — 400 — (1) Value guaranteed by characterization, not 100% tested in production. (2) Value guaranteed by design, not 100% tested in production. (3) Value given with main PLL running. 4.10. Memory characteristics Table 4-26. Flash memory characteristics Symbol Parameter Conditions Min(1) Typ(1) Max(2) Unit PECYC Number of guaranteed program /erase cycles before failure (Endurance) — 100 — — kcycles tRET Data retention time — — 20 — years tPROG Word programming time TA = -40°C ~ +105 °C — 1 — ms tERASE4kB Sector(4kB) erase time TA = -40°C ~ +105 °C — 100 — ms tMERASE(1MB) Mass erase time TA = -40°C ~ +105 °C — 8 — s tMERASE(2MB) Mass erase time TA = -40°C ~ +105 °C — 16 — s tMERASE(3840kB) Mass erase time TA = -40°C ~ +105 °C — 30 — s (1) Value guaranteed by characterization, not 100% tested in production. (2) Value guaranteed by design, not 100% tested in production. 4.11. NRST pin characteristics Table 4-27. NRST pin characteristics Symbol Parameter Conditions Min Typ Max Unit VIL(NRST)(2) NRST Input low level voltage VDD = VDDA = 1.71 V -0.3 — 0.3 VDD V VIH(NRST)(2) NRST Input high level voltage 0.7 VDD — VDD + 0.3 Vhyst(1) Schmidt trigger Voltage hysteresis — 300 — mV VIL(NRST)(2) NRST Input low level voltage VDD = VDDA = 3.3 V -0.3 — 0.3 VDD V VIH(NRST)(2) NRST Input high level voltage 0.7 VDD — VDD + 0.3 Vhyst(1) Schmidt trigger Voltage hysteresis — 310 — mV |
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