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BQ25708 Folha de dados(PDF) 18 Page - Texas Instruments |
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BQ25708 Folha de dados(HTML) 18 Page - Texas Instruments |
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18 / 94 page ![]() 8.5 Electrical Characteristics (continued) over TJ = -40°C to 125°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT LOGIC INPUT (SDA, SCL, OTG/VAP) VIN_ LO Input low threshold I2C 0.4 V VIN_ HI Input high threshold I2C 1.3 V LOGIC OUTPUT OPEN DRAIN (SDA, CHRG_OK, CMPOUT) VOUT_ LO Output saturation voltage 5 mA drain current 0.4 V VOUT_ LEAK Leakage current V = 7 V –1 1 µA LOGIC OUTPUT OPEN DRAIN SDA VOUT_ LO_SDA Output Saturation Voltage 5 mA drain current 0.4 V VOUT_ LEAK_SDA Leakage Current V = 7V –1 1 µA LOGIC OUTPUT OPEN DRAIN CHRG_OK VOUT_ LO_CHRG_OK Output Saturation Voltage 5 mA drain current 0.4 V VOUT_ LEAK _CHRG_OK Leakage Current V = 7V –1 1 µA LOGIC OUTPUT OPEN DRAIN CMPOUT VOUT_ LO_CMPOUT Output Saturation Voltage 5 mA drain current 0.4 V VOUT_ LEAK _CMPOUT Leakage Current V = 7V –1 1 µA LOGIC OUTPUT OPEN DRAIN (PROCHOT) VOUT_ LO_PROCHOT Output saturation voltage 50 Ω pullup to 1.05 V / 5-mA 300 mV VOUT_ LEAK_PROCHOT Leakage current V = 5.5 V –1 1 µA ANALOG INPUT (ILIM_HIZ) VHIZ_ LO Voltage to get out of HIZ mode ILIM_HIZ pin rising 0.8 V VHIZ_ HIGH Voltage to enable HIZ mode ILIM_HIZ pin falling 0.4 V ANALOG INPUT (CELL_BATPRESZ) VCELL_4S 4S REGN of REGN = 6 V, as percentage 68.4 75 % VCELL_3S 3S REGN of REGN = 6 V, as percentage 51.7 55 65 % VCELL_2S 2S REGN of REGN = 6 V, as percentage 35 40 49.1 % VCELL_1S 1S REGN of REGN = 6 V, as percentage 18.4 25 31.6 % VCELL_BATPRESZ_RISE Battery is present CELL_BATPRESZ rising 18 % VCELL_BATPRESZ_FALL Battery is removed CELL_BATPRESZ falling 15 % 8.6 Timing Requirements MIN NOM MAX UNIT I2C TIMING CHARACTERISTICS tr SCLK/SDATA rise time 300 ns tf SCLK/SDATA fall time 300 ns tW(H) SCLK pulse width high 0.6 50 µs tW(L) SCLK Pulse Width Low 1.3 µs tSU(STA) Setup time for START condition 0.6 µs tH(STA) START condition hold time after which first clock pulse is generated 0.6 µs tSU(DAT) Data setup time 100 ns tH(DAT) Data hold time 300 ns tSU(STOP) Setup time for STOP condition 0.6 µs BQ25713, BQ25713B SLUSD83C – JUNE 2018 – REVISED MAY 2023 www.ti.com 18 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated Product Folder Links: BQ25713 BQ25713B |
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