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STO67N60M6 Folha de dados(PDF) 4 Page - STMicroelectronics |
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STO67N60M6 Folha de dados(HTML) 4 Page - STMicroelectronics |
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4 / 15 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 34 A ISDM(1) Source-drain current (pulsed) - 200 A VSD(2) Forward on voltage VGS = 0 V, ISD = 52 A - 1.6 V trr Reverse recovery time ISD = 52 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 348 ns Qrr Reverse recovery charge - 5.6 µC IRRM Reverse recovery current - 32 A trr Reverse recovery time ISD = 52 A, di/dt = 100 A/µs, VDD = 60 V, TJ = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 484 ns Qrr Reverse recovery charge - 10.6 µC IRRM Reverse recovery current - 44 A 1. Pulse width is limited by safe operating area. 2. Pulse test: pulse duration = 300 µs, duty cycle 1.5%. STO67N60M6 Electrical characteristics DS13208 - Rev 2 page 4/15 |
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