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KM68512B Folha de dados(PDF) 8 Page - Samsung semiconductor

Nome de Peças KM68512B
Descrição Electrónicos  64Kx8 bit Low Power CMOS Static RAM
PDF  9 Pages
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Fabricante Electrônico  SAMSUNG [Samsung semiconductor]
Página de início  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

KM68512B Folha de dados(HTML) 8 Page - Samsung semiconductor

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Revision 0.0
KM68512B Family
CMOS SRAM
January 1998
8
Advance
DATA RETENTION WAVE FORM
CS1 controlled
VCC
4.5V
2.2V
VDR
CS1
GND
Data Retention Mode
CS
≥VCC - 0.2V
tSDR
tRDR
TIMING WAVEFORM OF WRITE CYCLE(3)
(CS1 Controlled)
Address
CS1
tAW
NOTES (WRITE CYCLE)
1. A write occurs during the overlap of a low CS1, a high CS2 and a low WE. A write begins at the latest transition among CS1 goes low,
CS2 going high and WE going low : A write end at the earliest transition among CS1 going high, CS2 going low and WE going high,
tWP is measured from the begining of write to the end of write.
2. tCW is measured from the CS1 going low or CS2 going high to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR(1) applied in case a write ends as CS1 or WE going high tWR(2)
applied in case a write ends as CS2 going to low.
CS2
tWP(2)
WE
Data in
Data Valid
Data out
High-Z
High-Z
tCW(2)
tWR(4)
tWP(1)
tDW
tDH
tAS(3)
tWC
CS2 controlled
VCC
4.5V*
0.4V
VDR
CS2
GND
Data Retention Mode
tSDR
tRDR
CS2
≤0.2V



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