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P4C164L-100P3CLF Folha de dados(PDF) 5 Page - Pyramid Semiconductor Corporation |
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P4C164L-100P3CLF Folha de dados(HTML) 5 Page - Pyramid Semiconductor Corporation |
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5 / 11 page ![]() P4C164L Page 5 of 11 Document # SRAM116 REV B AC CHARACTERISTICS - WRITE CYCLE (Over Recommended Operating Temperature & Supply Voltage) WRITE CYCLE NO. 1 ( WE WE WE WE WE CONTROLLED)(6) Symbol Parameter -80 Max -100 Max Unit Min Min t WC t CW t AS t WP t AH t DH t WZ t OW Write Cycle Time 80 100 ns Chip Enable Time to End of Write 70 80 ns Address Valid to End of Write 70 80 ns Address Set-up Time 00 ns Write Pulse Width 60 60 ns Address Hold Time 00 ns Data Valid to End of Write 40 40 ns Data Hold Time 0 0 ns Write Enable to Output in High Z 30 30 ns Output Active from End of Write 10 10 ns t AW t DW Notes: 11. CE 1 and WE must be LOW, and CE2 HIGH for WRITE cycle. 12. OE is LOW for this WRITE cycle to show t WZ and tOW. 13. If CE 1 goes HIGH, or CE2 goes LOW, simultaneously with WE HIGH, the output remains in a high impedance state. 14. Write Cycle Time is measured from the last valid address to the first transitioning address. |
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