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8413S12B Folha de dados(PDF) 9 Page - Renesas Technology Corp

Nome de Peças 8413S12B
Descrição Electrónicos  HCSL/ LVCMOS Clock Generator
PDF  34 Pages
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Fabricante Electrônico  RENESAS [Renesas Technology Corp]
Página de início  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

8413S12B Folha de dados(HTML) 9 Page - Renesas Technology Corp

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©2016 Integrated Device Technology, Inc.
Revision E, August 18, 2016
8413S12B Datasheet.
Table 7C. Jitter Specifications for Network Processor Core Clocks and High Speed PLLs, VDD = 3.3V ± 5%, VDDO_[A:E] =
3.3V ± 5%; and VDD = 3.3V ± 5%, VDDO_G = VDDO_QREF = 3.3V ± 5%, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions. For additional information, refer to the Network Processor Core Clocks and High Speed
PLLs Application Note section in the datasheet.
NOTE 1: Total phase jitter after applying the evaluation bands to the system transfer function for Network Processor Clock Architecture and
High Speed PLLs. The transfer function is defined and illustrated in the Network Processor Core Clocks and High Speed PLLs Application
Note section in the datasheet.
NOTE 2: Measurement in the Frequency Domain. Evaluation Band with PLL mask applied: 10Hz - 40MHz.
NOTE 3: Jitter data is measured with Agilent E5052A Signal Source Analyzer.
Table 7D. AC Characteristics, VDD = 3.3V ± 5%, VDDO_[A:E] = VDDO_F = 3.3V ± 5%; and
VDD = 3.3V ± 5%, VDDO_G = VDDO_QREF = 3.3V ± 5% or 2.5V ± 5%, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
Symbol
Parameter
Test Conditions
Output
Minimum
Typical
Maximum
Units
JCORE_REFCLK
Total Jitter;
Peak-to-Peak
NOTE 1, 2, 3
ƒ = 50MHz, 25MHz Crystal Input,
Internal Processor PLL BW=1MHz
QF
32.8
70
ps
ƒ = 50MHz, 25MHz Crystal Input,
Internal Processor PLL BW=2MHz
QF
33
70.01
ps
ƒ = 50MHz, 25MHz Crystal Input,
Internal Processor PLL BW = 5MHz
QF
33.6
70.05
ps
ƒ = 50MHz, 25MHz Crystal Input,
Internal Processor PLL BW = 8MHz
QF
34.5
71.2
ps
ƒ = 50MHz, 25MHz Crystal Input,
Internal Processor PLL BW = 10MHz
QF
35.3
71.9
ps
JPLL_REFCLK
Total Jitter,
Peak-to-Peak
NOTE 1, 2, 3
ƒ = 125MHz, 25MHz Crystal Input,
High Speed PLL BW = 1MHz
QG
39.5
86.7
ps
ƒ = 125MHz, 25MHz Crystal Input,
High Speed PLL BW = 2MHz
QG
39.5
86.7
ps
ƒ = 125MHz, 25MHz Crystal Input,
High Speed PLL BW = 5MHz
QG
39.9
86.9
ps
ƒ = 125MHz, 25MHz Crystal Input,
High Speed PLL BW = 8MHz
QG
41.6
88.4
ps
ƒ = 125MHz, 25MHz Crystal Input,
High Speed PLL BW = 10MHz
QG
43.3
90
ps
Symbol
Parameter
Test Conditions
Output
Minimum
Typical
Maximum
Units
fOUT
Output Frequency
FSEL_[A:E] = 00
Q[A:E], nQ[A:E]
100
MHz
FSEL_[A:E] = 01
Q[A:E], nQ[A:E]
125
MHz
FSEL_[A:E] = 10
Q[A:E], nQ[A:E]
156.25
MHz
FSEL_[A:E] = 11
Q[A:E], nQ[A:E]
312.5
MHz
QF
50
MHz
QG
125
MHz
QREF[0:1]
25
MHz



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