LQFP176 datasheet(85/133 Pages) STMICROELECTRONICS

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SPC560B54x/6x

Electrical characteristics

132

ECC circuitry provides correction of single bit faults and is used to improve further

automotive reliability results. Some units will experience single bit corrections throughout

the life of the product with no impact to product reliability.

4.10.2

Flash power supply DC characteristics

Table 32 shows the power supply DC characteristics on external supply.

Table 30. Flash module life

Symbol

Parameter

Conditions

Value

Unit

Min

Typ

Max

P/E

CC C

Number of program/erase

cycles per block for 16 KB

blocks over the operating

temperature range (TJ)

—

100000

—

cycles

P/E

CC C

Number of program/erase

cycles per block for 32 KB

blocks over the operating

temperature range (TJ)

—

10000

100000

—

cycles

P/E

CC C

Number of program/erase

cycles per block for 128 KB

blocks over the operating

temperature range (TJ)

—

1000

100000

—

cycles

Retention

CC C

Minimum data retention at

85 °C average ambient

temperature(1)

Blocks with

0–1000 P/E cycles

—

years

Blocks with

1001–10000 P/E

cycles

—

years

Blocks with

10001–100000 P/E

cycles

5—

—

years

Ambient temperature averaged over duration of application, not to exceed recommended product operating temperature

range.

Table 31. Flash read access timing

Symbol

Parameter

Conditions(1)

Max

Unit

fREAD

Maximum frequency for Flash reading

2 wait states

MHz

1 wait state

0 wait states

VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified.

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