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LQFP176 Folha de dados(PDF) 84 Page - STMicroelectronics |
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LQFP176 Folha de dados(HTML) 84 Page - STMicroelectronics |
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84 / 133 page ![]() Electrical characteristics SPC560B54x/6x 84/133 DocID15131 Rev 9 4.10 Flash memory electrical characteristics 4.10.1 Program/erase characteristics Table 29 shows the program and erase characteristics. 6. Data Flash Power Down. Code Flash in Low Power. SIRC 128 kHz and FIRC 16 MHz on. 10 MHz XTAL clock. FlexCAN: instances: 0, 1, 2 ON (clocked but not reception or transmission), instances: 4, 5, 6 clocks gated. LINFlex: instances: 0, 1, 2 ON (clocked but not reception or transmission), instance: 3 to 9 clocks gated. eMIOS: instance: 0 ON (16 channels on PA[0]–PA[11] and PC[12]–PC[15]) with PWM 20 kHz, instance: 1 clock gated. DSPI: instance: 0 (clocked but no communication), instance: 1 to 5 clocks gated. RTC/API ON. PIT ON. STM ON. ADC1 OFF. ADC0 ON but no conversion except two analog watchdogs. 7. Only for the “P” classification: No clock, FIRC 16 MHz off, SIRC 128 kHz on, PLL off, HPVreg off, ULPVreg/LPVreg on. All possible peripherals off and clock gated. Flash in power down mode. 8. When going from RUN to STOP mode and the core consumption is > 6 mA, it is normal operation for the main regulator module to be kept on by the on-chip current monitoring circuit. This is most likely to occur with junction temperatures exceeding 125 °C and under these circumstances, it is possible for the current to initially exceed the maximum STOP specification by up to 2 mA. After entering stop, the application junction temperature will reduce to the ambient level and the main regulator will be automatically switched off when the load current is below 6 mA. 9. Only for the “P” classification: ULPreg on, HP/LPVreg off, 32 KB RAM on, device configured for minimum consumption, all possible modules switched off. 10. ULPreg on, HP/LPVreg off, 8 KB RAM on, device configured for minimum consumption, all possible modules switched off. Table 29. Program and erase specifications Symbol C Parameter Conditions Value Unit Min Typ (1) Initial max (2) Max (3) tdwprogram C C C Double word (64 bits) program time(4) Code Flash — 18 50 500 µs Data Flash 22 t16Kpperase 16 KB block preprogram and erase time Code Flash — 200 500 5000 ms Data Flash 300 t32Kpperase 32 KB block preprogram and erase time Code Flash — 300 600 5000 ms Data Flash 400 t128Kpperase 128 KB block preprogram and erase time Code Flash — 600 1300 7500 ms Data Flash 800 tesus D Erase Suspend Latency — — — 30 30 µs tESRT C Erase Suspend Request Rate(5) Code Flash 20 — — — ms Data Flash 10 — — — 1. Typical program and erase times assume nominal supply values and operation at 25 °C. All times are subject to change pending device characterization. 2. Initial factory condition: < 100 program/erase cycles, 25 °C, typical supply voltage. 3. The maximum program and erase times occur after the specified number of program/erase cycles. These maximum values are characterized but not guaranteed. 4. Actual hardware programming times. This does not include software overhead. 5. Time between erase suspend resume and the next erase suspend request. |
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