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IRHN7450SE Folha de dados(PDF) 1 Page - International Rectifier

Nome de Peças IRHN7450SE
Descrição Electrónicos  TRANSISTOR N-CHANNEL(BVdss=500V, Rds(on)=0.51ohm, Id=12A)
PDF  4 Pages
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Fabricante Electrônico  IRF [International Rectifier]
Página de início  http://www.irf.com
Logo IRF - International Rectifier

IRHN7450SE Folha de dados(HTML) 1 Page - International Rectifier

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Product Summary
Part Number
BVDSS
RDS(on)
ID
IRHN7450SE
500V
0.51
12A
Features:
s
Radiation Hardened up to 1 x 105 Rads (Si)
s
Single Event Burnout (SEB) Hardened
s
Single Event Gate Rupture (SEGR) Hardened
s
Gamma Dot (Flash X-Ray) Hardened
s
Neutron Tolerant
s
Identical Pre- and Post-Electrical Test Conditions
s
Repetitive Avalanche Rating
s
Dynamic dv/dt Rating
s
Simple Drive Requirements
s
Ease of Paralleling
s
Hermetically Sealed
s
Surface Mount
s
Lightweight
Absolute Maximum Ratings
Parameter
IRHN7450SE
Units
ID @ VGS = 12V, TC = 25°C
Continuous Drain Current
12
ID @ VGS = 12V, TC = 100°C Continuous Drain Current
7.0
IDM
Pulsed Drain CurrentŒ
48
PD @ TC = 25°C
Max. Power Dissipation
150
W
Linear Derating Factor
1.2
W/K 
VGS
Gate-to-Source Voltage
±20
V
EAS
Single PulseAvalanche Energy
500
mJ
IAR
Avalanche CurrentŒ
12
A
EAR
RepetitiveAvalanche EnergyŒ
15
mJ
dv/dt
Peak Diode Recovery dv/dt Ž
3.5
V/ns
TJ
Operating Junction
-55 to 150
TSTG
StorageTemperature Range
Package Mounting Surface Temperature
300 (for 5 seconds)
Weight
2.6 (typical)
g
N-CHANNEL
SINGLE EVENT EFFECT (SEE) RAD HARD
Provisional Data Sheet No. PD-9.1313A
Pre-Radiation
500 Volt, 0.51
Ω, (SEE) RAD HARD HEXFET
International Rectifier’s (SEE) RAD HARD technology
HEXFETs demonstrate virtual immunity to SEE fail-
ure. Additionally, under identical pre- and post-radia-
tion test conditions, International Rectifier’s RAD HARD
HEXFETs retain identical electrical specifications up
to 1 x 105 Rads (Si) total dose. No compensation in
gate drive circuitry is required. These devices are also
capable of surviving transient ionization pulses as high
as 1 x 1012 Rads (Si)/Sec, and return to normal opera-
tion within a few microseconds. Since the SEE pro-
cess utilizes International Rectifier’s patented HEXFET
technology, the user can expect the highest quality
and reliability in the industry.
RAD HARD HEXFET transistors also feature all of the
well-established advantages of MOSFETs, such as volt-
age control, very fast switching, ease of paralleling and
temperature stability of the electrical parameters.
They are well-suited for applications such as switch-
ing power supplies, motor controls, inverters, chop-
pers, audio amplifiers and high-energy pulse circuits
in space and weapons environments.
IRHN7450SE
REPETITIVE AVALANCHE AND dv/dt RATED
HEXFET® TRANSISTOR
oC
A
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