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HC705JB2GRS/H Folha de dados(PDF) 109 Page - NXP Semiconductors |
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HC705JB2GRS/H Folha de dados(HTML) 109 Page - NXP Semiconductors |
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109 / 128 page ![]() August 28, 1998 GENERAL RELEASE SPECIFICATION INSTRUCTION SET REV 1.1 12-5 12.1.11 Read-Modify-Write Instructions These instructions read a memory location or a register, modify its contents, and write the modified value back to the memory location or to the register. The test for negative or zero instruction (TST) is an exception to the read-modify-write sequence because it does not write a replacement value. Table 12-2 lists the read-modify-write instructions. 12.1.12 Jump/Branch Instructions Jump instructions allow the CPU to interrupt the normal sequence of the program counter. The unconditional jump instruction (JMP) and the jump to subroutine instruction (JSR) have no register operand. Branch instructions allow the CPU to interrupt the normal sequence of the program counter when a test condition is met. If the test condition is not met, the branch is not performed. All branch instructions use relative addressing. Bit test and branch instructions cause a branch based on the state of any readable bit in the first 256 memory locations. These three-byte instructions use a combination of direct addressing and relative addressing. The direct address of the byte to be tested is in the byte following the opcode. The third byte is the signed offset byte. The CPU finds the conditional branch destination by adding the Table 12-2. Read-Modify-Write Instructions Instruction Mnemonic Arithmetic Shift Left ASL Arithmetic Shift Right ASR Clear Bit in Memory BCLR Set Bit in Memory BSET Clear CLR Complement (One’s Complement) COM Decrement DEC Increment INC Logical Shift Left LSL Logical Shift Right LSR Negate (Two’s Complement) NEG Rotate Left through Carry Bit ROL Rotate Right through Carry Bit ROR Test for Negative or Zero TST Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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