STM32MP157C datasheet(40/260 Pages) STMICROELECTRONICS

40 / 260 page

Functional overview

STM32MP157C/F

40/260

DS12505 Rev 5

3.22

Analog-to-digital converters (ADCs)

The STM32MP157C/F devices embed two analog-to-digital converters, which resolution

can be configured to 16, 14, 12, 10 or 8 bits. Each ADC shares up to 20 external channels,

performing conversions in the single-shot or scan mode. In scan mode, automatic

conversion is performed on a selected group of analog inputs.

Additional logic functions embedded in the ADC interface allow:

•

simultaneous ADC1/ADC2 conversion

•

interleaved ADC1/ADC2 conversion.

The ADC can be served by the DMA controller, thus allowing the automatic transfer of ADC

converted values to a destination location without any software action.

In addition, an analog watchdog feature can accurately monitor the converted voltage of

one, some or all selected channels. An interrupt is generated when the converted voltage is

outside the programmed thresholds.

In order to synchronize A/D conversion and timers, the ADCs can be triggered by any of

TIM1, TIM2, TIM3, TIM4, TIM6, TIM8, TIM15, LPTIM1, LPTIM2 and LPTIM3 timers.

3.23

Temperature sensor

The STM32MP157C/F devices embed a temperature sensor that generates a voltage (VTS)

that varies linearly with the temperature. This temperature sensor is internally connected to

ADC2_INP12. It can measure the device ambient temperature ranging from –40 to +125 °C

with a precision of ±2%.

The temperature sensor has a good linearity, but it has to be calibrated to obtain a good

overall accuracy of the temperature measurement. As the temperature sensor offset varies

from chip to chip due to process variation, the uncalibrated internal temperature sensor is

suitable for applications that detect temperature changes only. To improve the accuracy of

the temperature sensor measurement, each device is individually factory-calibrated by ST.

The temperature sensor factory calibration data are stored by ST in the OTP area, which is

accessible in read-only mode.

3.24

Digital temperature sensor (DTS)

The device embeds a frequency output temperature sensor. This block counts the

frequency based on the LSE or PCLK to provide the temperature information.

Following functions can be supported:

•

Interrupt generation by temperature threshold.

•

Wakeup signal generation by temperature threshold.

3.25

VBAT operation

The VBAT power domain contains the RTC, the backup registers, the retention RAM and the

backup SRAM.

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