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SPC56EL70L3 Folha de dados(PDF) 32 Page - STMicroelectronics |
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SPC56EL70L3 Folha de dados(HTML) 32 Page - STMicroelectronics |
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32 / 128 page ![]() Introduction SPC56EL70L3, SPC56EL70L5,PC564L70L3, SPC564L70L5 32/128 DocID023953 Rev 5 1.5.41 Built-In self-test (BIST) capability This device includes the following protection against latent faults: Boot-time Memory Built-In Self-Test (MBIST) Boot-time scan-based Logic Built-In Self-Test (LBIST) Run-time ADC Built-In Self-Test (BIST) Run-time Built-In Self Test of LVDs |
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