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LP2995 Folha de dados(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Nome de Peças LP2995
Descrição Electrónicos  DDR Termination Regulator
PDF  13 Pages
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Fabricante Electrônico  NSC [National Semiconductor (TI)]
Página de início  http://www.national.com
Logo NSC - National Semiconductor (TI)

LP2995 Folha de dados(HTML) 3 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
PVIN, AVIN, VDDQ to GND
−0.3V to +6V
Storage Temp. Range
−65˚C to +150˚C
Junction Temperature
150˚C
SO-8 Thermal Resistance (
θ
JA)
151˚C/W
LLP-16 Thermal Resistance (
θ
JA)
51˚C/W
Lead Temperature (Soldering, 10 sec)
260˚C
ESD Rating (Note 7)
1kV
Operating Range
Junction Temp. Range (Note 5)
0˚C to +125˚C
AVIN to GND
2.2V to 5.5V
PVIN to GND
2.2V to AVIN
Electrical Characteristics Specifications with standard typeface are for T
J = 25˚C and limits in boldface
type apply over the full Operating Temperature Range (T
J = 0˚C to +125˚C). Unless otherwise specified,
AVIN = PVIN = 2.5V, VDDQ = 2.5V (Note 6).
Symbol
Parameter
Conditions
Min
Typ
Max
Units
V
REF
V
REF Voltage
I
REF_OUT = 0mA
1.21
1.235
1.26
V
VOS
VTT
V
TT Output Voltage Offset
I
OUT =0A
(Note 2)
−15
−20
015
20
mV
∆V
TT/VTT
Load Regulation
(Note 3)
I
OUT = 0 to 1.5A
0.5
%
I
OUT = 0 to −1.5A
−0.5
Z
VREF
V
REF Output Impedance
I
REF = −5µA to +5µA
5
k
Z
VDDQ
VDDQ Input Impedance
100
k
I
q
Quiescent Current
I
OUT =0A
(Note 4)
250
400
µA
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics. The
guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed
test conditions.
Note 2: VTT offset is the voltage measurement defined as VTT subtracted from VREF.
Note 3: Load regulation is tested by using a 10ms current pulse and measuring VTT.
Note 4: Quiescent current defined as the current flow into AVIN.
Note 5: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at
θJA = 151˚ C/W
junction to ambient with no heat sink. The device in the LLP-16 must be derated at
θJA = 51˚ C/W junction to ambient.
Note 6: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control
(SQC) methods. The limits are used to calculate National’s Average Outgoing Quality Level (AOQL).
Note 7: The human body model is a 100pF capacitor discharged through a 1.5k
Ω resistor into each pin.
www.national.com
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