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IRHN7450SE Folha de dados(PDF) 3 Page - International Rectifier |
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IRHN7450SE Folha de dados(HTML) 3 Page - International Rectifier |
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3 / 8 page ![]() www.irf.com 3 Pre-Irradiation Pre-Irradiation Pre-Irradiation Pre-Irradiation Pre-Irradiation IRHN7450SE IRHN7450SE IRHN7450SE IRHN7450SE IRHN7450SE Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ➄➅ International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability. The hardness assurance program at International Rectifier is comprised of two radiation environments. Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions in order to provide a direct comparison. Fig a. Fig a. Fig a. Fig a. Fig a. Single Event Effect, Safe Operating Area International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2. Table 2. Single Event Effect Safe Operating Area Table 2. Single Event Effect Safe Operating Area Table 2. Single Event Effect Safe Operating Area Table 2. Single Event Effect Safe Operating Area Table 2. Single Event Effect Safe Operating Area For footnotes refer to the last page Parameter Parameter Parameter Parameter Parameter 100K Rads (Si) Units Units Units Units Units Test Conditions Test Conditions Test Conditions Test Conditions Test Conditions " Min Min Min Min Min Max Max Max Max Max BVDSS Drain-to-Source Breakdown Voltage 500 V VGS = 0V, ID = 1.0mA V/5JD Gate Threshold Voltage 2.0 4.5 VGS = VDS, ID = 1.0mA IGSS Gate-to-Source Leakage Forward 100 nA VGS = 20V IGSS Gate-to-Source Leakage Reverse -100 VGS = -20V IDSS Zero Gate Voltage Drain Current 50 µA VDS= 400V, VGS=0V RDS(on) Static Drain-to-Source#$ On-State Resistance (TO-3) 0.51 Ω VGS = 12V, ID = 7.0A RDS(on) Static Drain-to-Source#$ On-State Resistance (SMD-1) 0.51 Ω VGS = 12V, ID = 7.0A VSD Diode Forward Voltage#$ 1.6 V VGS = 0V, ID = 12A Ion Ion Ion Ion Ion LET LET LET LET LET Energy Range Energy Range Energy Range Energy Range Energy Range V VV V V ,5 ,5 ,5 ,5 ,5 (V) (V) (V) (V) (V) MeV/(mg/cm )) (MeV) (µm) @V @V @V @V @V /5 /5 /5 /5 /5=0V @V =0V @V =0V @V =0V @V =0V @V /5 /5 /5 /5 /5=-5V @V =-5V @V =-5V @V =-5V @V =-5V @V /5 /5 /5 /5 /5=-10V @V =-10V @V =-10V @V =-10V @V =-10V @V /5 /5 /5 /5 /5=-15V @V =-15V @V =-15V @V =-15V @V =-15V @V /5 /5 /5 /5 /5=-20V =-20V =-20V =-20V =-20V Cu 28 285 43 375 375 375 375 375 Br 36.8 305 39 350 350 350 325 300 Ni 26.6 265 42 375 0 100 200 300 400 0 -5 -10 -15 -20 VGS Cu Br Ni |
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