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IRHN7450SE Folha de dados(PDF) 3 Page - International Rectifier

Nome de Peças IRHN7450SE
Descrição Electrónicos  Simple Drive Requirements
PDF  8 Pages
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Fabricante Electrônico  IRF [International Rectifier]
Página de início  http://www.irf.com
Logo IRF - International Rectifier

IRHN7450SE Folha de dados(HTML) 3 Page - International Rectifier

  IRHN7450SE_15 Datasheet HTML 1Page - International Rectifier IRHN7450SE_15 Datasheet HTML 2Page - International Rectifier IRHN7450SE_15 Datasheet HTML 3Page - International Rectifier IRHN7450SE_15 Datasheet HTML 4Page - International Rectifier IRHN7450SE_15 Datasheet HTML 5Page - International Rectifier IRHN7450SE_15 Datasheet HTML 6Page - International Rectifier IRHN7450SE_15 Datasheet HTML 7Page - International Rectifier IRHN7450SE_15 Datasheet HTML 8Page - International Rectifier  
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Pre-Irradiation
Pre-Irradiation
Pre-Irradiation
Pre-Irradiation
Pre-Irradiation
IRHN7450SE
IRHN7450SE
IRHN7450SE
IRHN7450SE
IRHN7450SE
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ➄➅
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Fig a.
Fig a.
Fig a.
Fig a.
Fig a. Single Event Effect, Safe Operating Area
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Single Event Effect Safe Operating Area
Table 2. Single Event Effect Safe Operating Area
Table 2. Single Event Effect Safe Operating Area
Table 2. Single Event Effect Safe Operating Area
Table 2. Single Event Effect Safe Operating Area
For footnotes refer to the last page
Parameter
Parameter
Parameter
Parameter
Parameter
100K Rads (Si)
Units
Units
Units
Units
Units
Test Conditions
Test Conditions
Test Conditions
Test Conditions
Test Conditions "
Min
Min
Min
Min
Min
Max
Max
Max
Max
Max
BVDSS
Drain-to-Source Breakdown Voltage
500
—
V
VGS = 0V, ID = 1.0mA
V/5JD
Gate Threshold Voltage
2.0
4.5
VGS = VDS, ID = 1.0mA
IGSS
Gate-to-Source Leakage Forward
—
100
nA
VGS = 20V
IGSS
Gate-to-Source Leakage Reverse
—
-100
VGS = -20V
IDSS
Zero Gate Voltage Drain Current
—
50
µA
VDS= 400V, VGS=0V
RDS(on)
Static Drain-to-Source#$
On-State Resistance (TO-3)
—
0.51
VGS = 12V, ID = 7.0A
RDS(on)
Static Drain-to-Source#$
On-State Resistance (SMD-1)
—
0.51
VGS = 12V, ID = 7.0A
VSD
Diode Forward Voltage#$
—
1.6
V
VGS = 0V, ID = 12A
Ion
Ion
Ion
Ion
Ion
LET
LET
LET
LET
LET
Energy
Range
Energy
Range
Energy
Range
Energy
Range
Energy
Range
V
VV
V
V
,5
,5
,5
,5
,5 (V)
(V)
(V)
(V)
(V)
MeV/(mg/cm ))
(MeV)
(µm)
@V
@V
@V
@V
@V
/5
/5
/5
/5
/5=0V @V
=0V @V
=0V @V
=0V @V
=0V @V
/5
/5
/5
/5
/5=-5V @V
=-5V @V
=-5V @V
=-5V @V
=-5V @V
/5
/5
/5
/5
/5=-10V @V
=-10V @V
=-10V @V
=-10V @V
=-10V @V
/5
/5
/5
/5
/5=-15V @V
=-15V @V
=-15V @V
=-15V @V
=-15V @V
/5
/5
/5
/5
/5=-20V
=-20V
=-20V
=-20V
=-20V
Cu
28
285
43
375
375
375
375
375
Br
36.8
305
39
350
350
350
325
300
Ni
26.6
265
42
—
375
—
—
—
0
100
200
300
400
0
-5
-10
-15
-20
VGS
Cu
Br
Ni



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