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PCS2P5T907A Folha de dados(PDF) 14 Page - PulseCore Semiconductor

Nome de Peças PCS2P5T907A
Descrição Electrónicos  2.5V Single Data Rate 1:10 Clock Buffer Terabuffer
PDF  21 Pages
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Fabricante Electrônico  PULSECORE [PulseCore Semiconductor]
Página de início  http://www.onsemi.com/
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September 2006
PCS2P5T907A
rev 0.2
2.5V Single Data Rate 1:10 Clock Buffer Terabuffer
14 of 21
Notice: The information in this document is subject to change without notice.
AC Electrical Characteristics Over Operating Range
7
Symbol
Parameter
Min
Typ
Max
Unit
Skew Parameters
Single-Ended and Differential
Modes
25
tSK(O)
Same Device Output Pin-to-
Pin Skew
1
Single-Ended in Differential
Mode (DSE)
25
pS
Single-Ended and Differential
Modes
300
tSK(P)
2
Pulse Skew
3
Single-Ended in Differential
Mode (DSE)
300
pS
Single-Ended and Differential
Modes
350
tSK(P)
4
Pulse Skew
3
Single-Ended in Differential
Mode (DSE)
350
pS
dT
5
Duty Cycle
40
60
%
Single-Ended and Differential
Modes
300
tSK(PP)
Part-to-Part Skew
6
Single-Ended in Differential
Mode (DSE)
300
pS
Propagation Delay
tPLH
tPHL
Propagation Delay A to Qn
2.5
nS
2.5V/1.8V LVTTL Outputs
350
1050
tR
Output Rise Time (20% to 80%)
HSTL / eHSTL Outputs
350
1350
pS
2.5V/1.8V LVTTL Outputs
350
1050
tF
Output Fall Time (20% to 80%)
HSTL / eHSTL Outputs
350
1350
pS
Frequency Range (HSTL/eHSTL outputs)
250
fO
Frequency Range (2.5V/1.8V LVTTL outputs)
200
MHz
Output Gate Enable/Disable Delay
tPGE
Output Gate Enable to Qn
3.5
nS
tPGD
Output Gate Enable to Qn Driven to GL Designated Level
3
nS
NOTES:
1. Skew measured between all outputs under identical input and output interfaces, transitions, and load conditions on any one device.
2. For 1.8V LVTTL and eHSTL outputs only.
3. Skew measured is difference between propagation times tPLH and tPHL of any output under identical input and output interfaces, transitions, and load
conditions on any one device.
4. For 2.5V LVTTL outputs only.
5. For HSTL outputs only.
6. Skew measured is the magnitude of the difference in propagation times between any outputs of two devices, given identical transitions and load conditions at
identical VDD/VDDQ levels and temperature.
7. Guaranteed by design.



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