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PCS2P5T907A Folha de dados(PDF) 7 Page - PulseCore Semiconductor |
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PCS2P5T907A Folha de dados(HTML) 7 Page - PulseCore Semiconductor |
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7 / 21 page ![]() September 2006 PCS2P5T907A rev 0.2 2.5V Single Data Rate 1:10 Clock Buffer Terabuffer 7 of 21 Notice: The information in this document is subject to change without notice. Power Supply Characteristics for HSTL Outputs 1 Symbol Parameter Test Conditions 2 Typ Max Unit IDDQ Quiescent VDD Power Supply Current VDDQ= Max., Reference Clock = LOW 3 Outputs enabled, All outputs unloaded 20 30 mA IDDQQ Quiescent VDDQ Power Supply Current VDDQ= Max., Reference Clock = LOW 3 Outputs enabled, All outputs unloaded 0.1 0.3 mA IDDD Dynamic VDD Power Supply Current per Output VDD= Max., VDDQ= Max., CL= 0pF 20 30 µA/MHz IDDDQ Dynamic VDDQ Power Supply Current per Output VDD= Max., VDDQ= Max., CL= 0pF 30 50 µA/MHz VDDQ= 1.5V, FREFERENCE CLOCK =100MHz, CL= 15pF 20 40 ITOT Total Power VDD Supply Current VDDQ= 1.5V, FREFERENCE CLOCK =250MHz, CL= 15pF 35 50 mA VDDQ= 1.5V, FREFERENCE CLOCK =100MHz, CL= 15pF 35 70 ITOTQ Total Power VDDQ Supply Current VDDQ= 1.5V, FREFERENCE CLOCK =250MHz, CL= 15pF 50 100 mA NOTES: 1. These power consumption characteristics are for all the valid input interfaces and cover the worst case input and output interface combinations. 2. The termination resistors are excluded from these measurements. 3. If the differential input interface is used, the true input is held LOW and the complementary input is held HIGH. Differential Input AC Test Conditions for HSTL Symbol Parameter Value Units VDIF Input Signal Swing 1 1 V VX Differential Input Signal Crossing Point 2 750 mV VTHI Input Timing Measurement Reference Level 3 Crossing Point V tR, tF Input Signal Edge Rate 4 1 V/nS NOTES: 1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. Compliant devices must meet the VDIF (AC) specification under actual use conditions. 2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. Compliant devices must meet the VX specification under actual use conditions. 3. In all cases, input waveform timing is marked at the differential cross-point of the input signals. 4. The input signal edge rate of 1V/nS or greater is to be maintained in the 20% to 80% range of the input waveform. |
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