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STM32F103X8 Folha de dados(PDF) 36 Page - STMicroelectronics |
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STM32F103X8 Folha de dados(HTML) 36 Page - STMicroelectronics |
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36 / 84 page ![]() Electrical characteristics STM32F103xx 36/84 Table 13. Maximum current consumption in Sleep mode, code running from Flash or RAM Symbol Parameter Conditions fHCLK Max Unit TA = 85 °C TA = 105 °C IDD Supply current in Sleep mode External clock(1), all peripherals enabled 72 MHz(2) 30 32 mA 48 MHz(3) 20 20.5 36 MHz(3) 15.5 16 24 MHz(3) 11.5 12 16 MHz(3) 8.5 9 8 MHz(3) 5.5 6 External clock(1), all peripherals disabled(3) 72 MHz 7.5 8 48 MHz 6 6.5 36 MHz 5 5.5 24 MHz 4.5 5 16 MHz 4 4.5 8 MHz 3 4 1. External clock is 8 MHz and PLL is on when fHCLK > 8 MHz; external clock is 9 MHz for fHCLK = 36 MHz. 2. Data based on characterization results, tested in production at VDD max, fHCLK max. and TA max. 3. Based on characterization, not tested in production. Table 14. Typical and maximum current consumptions in Stop and Standby modes(1) Symbol Parameter Conditions Typ(2) Max Unit VDD/VBAT = 2.4 V VDD/VBAT = 3.3 V TA = 85 °C TA = 105 °C IDD Supply current in Stop mode Regulator in Run mode, low-speed and high-speed internal RC oscillators and high-speed oscillator OFF (no independent watchdog) 23.5 24 200(3) TBD(3) µA Regulator in Low Power mode, low- speed and high-speed internal RC oscillators and high-speed oscillator OFF (no independent watchdog) 13.5 14 180(3) TBD(3) Supply current in Standby mode(4) Low-speed internal RC oscillator and independent watchdog OFF, low-speed oscillator and RTC OFF 1.7 2 4(3) 5(3) IDD_VBAT Backup domain supply current Low-speed oscillator and RTC ON 1.1 1.4 1.9(5) 2.2(5) 1. TBD stands for to be determined. 2. Typical values are measured at TA = 25 °C, VDD = 3.3 V, unless otherwise specified. 3. Data based on characterization results, tested in production at VDDmax and fHCLK max. 4. To have the Standby consumption with RTC ON, add IDD_VBAT (Low-speed oscillator and RTC ON) to IDD Standby (when VDD is present the Backup Domain is powered by VDD supply). 5. Data based on characterization results, not tested in production. |
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