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STPM098C Folha de dados(PDF) 27 Page - STMicroelectronics

Nome de Peças STPM098C
Descrição Electrónicos  Automotive dual digital 8-phase controller with PMBus™
PDF  110 Pages
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Fabricante Electrônico  STMICROELECTRONICS [STMicroelectronics]
Página de início  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STPM098C Folha de dados(HTML) 27 Page - STMicroelectronics

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3.4.2.1
Latched faults
When a latched fault is detected, the related PMBus™ flag is set to ‘1’ and related fault redirection pins are
asserted low. Internal logic reacts by establishing a SAFE_HIZ state: PWM outputs go in HIZ mode so that PWMn
= HIZ [n = 1, 2, 3, 4, 5, 6, 7, 8].
The SAFE_HIZ mode can be left when all the following conditions are met in this sequence:
1. Latched fault is removed.
2. Clear mechanism - One of the following actions, required by application software:
VR_EN1/VR_EN2 is asserted low for at least T_clear and then asserted back high.
CLEAR_FAULTS command by PMBus™ (clears all faults).
Dedicated clear commands by PMBus™ (clears single fault).
Note:
VR1_EN toggling is used to clear specific fault affecting loop 1. VR2_EN toggling is used to clear specific
fault affecting loop 2. Generic faults affecting both loops can be cleared by toggling either VR1_EN or
VR2_EN.
Faults clearing through the PMBus™ command make use of paging for faults affecting the specific loop.
Generic faults affecting both loops can be cleared independently of the command page.
Figure 15. Latched fault - Transient fault timing diagram
DRIVE
DRIVE
Fault
Occurrence
FAULT
(PMBus
Flag)
FAULT (pin)
VRRDY (pin)
SM_ALERT
(pin)
VRn_EN
PWMn
Fault disappear
Fault appear
t
Tclear (**)
3Tclk
HiZ
(*)
(*)
(*) Signaling Filter Time = Fault Detection + Reaction Time
(**) Tclear is the minimum time VRn_EN shall be asserted LOW for fault clear to be effective
Fault Detection +
Reaction Time
STPM098C
Functional description
DS14440 - Rev 1
page 27/110



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