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IRLL014 Folha de dados(PDF) 2 Page - EVER SEMICONDUCTOR CO.,LIMITED |
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IRLL014 Folha de dados(HTML) 2 Page - EVER SEMICONDUCTOR CO.,LIMITED |
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2 / 8 page ![]() Parameter Min. Typ. Max. Units Conditions V(BR)DSS Drain-to-Source Breakdown Voltage 55 V VGS = 0V, ID = 250µA ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient 0.015 V/°C Reference to 25°C, ID = 1mA 140 VGS = 10V, ID = 2.0A 200 m Ω VGS = 5.0V, ID = 1.2A 280 VGS = 4.0V, ID = 1.0A VGS(th) Gate Threshold Voltage 1.0 2.0 V VDS = VGS, ID = 250µA gfs Forward Transconductance 2.3 S VDS = 25V, ID = 1.0A 25 µA VDS = 55V, VGS = 0V 250 VDS = 44V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage 100 nA VGS = 16V Gate-to-Source Reverse Leakage -100 VGS = -16V Qg Total Gate Charge 9.5 14 ID = 2.0A Qgs Gate-to-Source Charge 1.1 1.7 nC VDS = 44V Qgd Gate-to-Drain ("Miller") Charge 3.0 4.4 VGS = 10V, See Fig. 6 and 9 td(on) Turn-On Delay Time 5.1 VDD = 28V tr Rise Time 4.9 ID = 2.0A ns td(off) Turn-Off Delay Time 14 RG = 6.0Ω tf Fall Time 2.9 RD = 14Ω, See Fig. 10 Ciss Input Capacitance 230 VGS = 0V Coss Output Capacitance 66 pF VDS = 25V Crss Reverse Transfer Capacitance 30 = 1.0MHz, See Fig. 5 IGSS RDS(on) Static Drain-to-Source On-Resistance IDSS Drain-to-Source Leakage Current Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) ISD ≤ 2.0A, di/dt ≤ 170A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C Notes: VDD = 25V, starting TJ = 25°C, L = 4.0mH RG = 25Ω, IAS = 4.0A. (See Figure 12) Pulse width ≤ 300µs; duty cycle ≤ 2%. IS Continuous Source Current MOSFET symbol (Body Diode) showing the ISM Pulsed Source Current integral reverse (Body Diode) p-n junction diode. VSD Diode Forward Voltage 1.0 V TJ = 25°C, IS = 2.0A, VGS = 0V trr Reverse Recovery Time 41 61 ns TJ = 25°C, IF = 2.0A Qrr Reverse RecoveryCharge 73 110 nC di/dt = 100A/µs ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) 16 1.3 A Electrical CharacteristicsT j = 25°C unless otherwise specifed 55V N-Channel MOSFET IRLL014 Page 2 of 8 Rev:2023A2 |
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