A3I25X050N A3I25X050GN

7

RF Device Data

NXP Semiconductors

Figure 5. A3I25X050N Test Circuit Component Layout — 2300–2400 MHz

A3I25X050N

D116211

cut out

area

Rev. 0

C23

C24

C17

C12

C16

C15

C10 C3

R4

R3

C14

C8

C1

C9

R1

R2

C5

C2

C6

C20

C4

C11

C13

C18

C19

C21

C22

C7

C26

C25

C23

aaa-035816

Table 9. A3I25X050N Test Circuit Component Designations and Values — 2300–2400 MHz

Part

Description

Part Number

Manufacturer

C1, C2, C3, C4, C5, C6, C7

10 pF Chip Capacitor

600F100JT250XT

ATC

C8, C9, C10, C11, C12, C13

1 F Chip Capacitor

GRM31CR72A105KA01L

Murata

C14, C15, C16, C17, C18

10 F Chip Capacitor

GRM32EC72A106KE05L

Murata

C19

1.5 pF Chip Capacitor

600F1R5BT250XT

ATC

C20

1.8 pF Chip Capacitor

600F1R8BT250XT

ATC

C21

1 pF Chip Capacitor

600F1R0BT250XT

ATC

C22

0.9 pF Chip Capacitor

600F0R9BT250XT

ATC

C23, C24, C25

330 F, 63 V Electrolytic Capacitor

MCRH63V337M13X21RH

Multicomp

C26

0.6 pF Chip Capacitor

600F0R6BT250XT

ATC

R1, R2

0 , 1/8 W Chip Resistor

CRCW08050000Z0EA

Vishay

R3, R4

3.57 k, 1/10 W Chip Resistor

RG1608P-3571-B-T5

Susumu

PCB

D116211

MTL