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AM652X Folha de dados(PDF) 239 Page - Texas Instruments

Nome de Peças AM652X
Descrição Electrónicos  Processors Silicon Revision 1.0
PDF  277 Pages
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Fabricante Electrônico  TI1 [Texas Instruments]
Página de início  http://www.ti.com
Logo TI1 - Texas Instruments

AM652X Folha de dados(HTML) 239 Page - Texas Instruments

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TDO
J2
J1
J4
TCK
J5
TDI / TMS
J3
J6
J7
J4
J5
TRC_DATA
TRC_CLK
(
)
(
)
Worst Case 1
(Ideal)
Worst Case 2
DBTR1
DBTR2
DBTR3
DBTR4
DBTR6
DBTR5
DBTR7
DBTR4
DBTR6
DBTR9
DBTR5
DBTR7
DBTR8
DBTR8
DBTR9
SPRSP08_Debug_01
239
AM6548, AM6528, AM6546
AM6526, AM6527
www.ti.com
SPRSP08I – NOVEMBER 2017 – REVISED DECEMBER 2019
Submit Documentation Feedback
Product Folder Links: AM6548 AM6528 AM6546 AM6526 AM6527
Specifications
Copyright © 2017–2019, Texas Instruments Incorporated
Figure 5-123. Debug Trace Timing
5.9.6.2
IEEE 1149.1 Standard-Test-Access Port (JTAG)
For more details about features and additional description information on the device IEEE 1149.1
Standard-Test-Access Port, see the corresponding sections within Section 4.3, Signal Descriptions and
Section 6, Detailed Description.
5.9.6.2.1 JTAG Electrical Data and Timing
Table 5-121, Table 5-122, and Figure 5-124 assume testing over the recommended operating conditions
and electrical characteristic conditions.
Table 5-121. Timing Requirements for IEEE 1149.1 JTAG
NO.
PARAMETER
DESCRIPTION
MIN
MAX
UNIT
J1
tc(TCK)
Cycle time minimum, TCK
75
ns
J2
tw(TCKH)
Pulse width minimum, TCK high
30
ns
J3
tw(TCKL)
Pulse width minimum, TCK low
30
ns
J4
tsu(TDI-TCK)
Input setup time minimum, TDI valid to TCK high
8
ns
tsu(TMS-TCK)
Input setup time minimum, TMS valid to TCK high
8
ns
J5
th(TCK-TDI)
Input hold time minimum, TDI valid from TCK high
5.2
ns
th(TCK-TMS)
Input hold time minimum, TMS valid from TCK high
5.2
ns
Table 5-122. Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
NO.
PARAMETER
DESCRIPTION
MIN
MAX
UNIT
J6
td(TCKL-TDOI)
Delay time minimum, TCK low to TDO invalid
0
ns
J7
td(TCKL-TDOV)
Delay time maximum, TCK low to TDO valid
27.75
ns
Figure 5-124. JTAG Test-Port Timing



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