MC33593

MOTOROLA SEMICONDUCTORS PRODUCTS

20

revision 7.0, 5 February 2002

© Motorola, Inc., 2002.

Note 3: Sensitivity measurement method with Data Manager disabled (DME=0)

A continuous Manchester coded 0 sequence (4.8kBd, OOK modulation depth: 100%, FSK modulation deviation:

35kHz, 50% duty cycle) is applied at RFIN. The mean value of the frequency of the output signal on MOSI is

measured over 200 cycles. The sensitivity is defined as the lowest input level during an NRZ one corresponding to

a mean output frequency deviation lower than 5% of the expected data rate.

Note 4: Sensitivity measurement method with Data Manager enabled (DME=1, HE=0)

A complete telegram (4.8kBd, OOK modulation depth: 100%, FSK modulation deviation: 35kHz, 50% duty cycle)

including preamble, ID word and data (80 random bits without Header) is applied at RFIN. The sensitivity is

defined as the lowest input level during an NRZ one necessary to achieve 0 Bit Error Rate (BER).

Note 5: 50

Ω matching networks

868MHz band: C1=100pF, L1=27nH, L2=27nH

Tolerances: +/-10% for capacitances; +/-2% for inductor

Note 6: Sensitivity measurement conditions

* OOK & FSK Modulation (+/-35kHz) at 4.8kBd (50% duty cycle)

* 868MHz band (500kHz IF bandwidth)

* Performances include receiver crystal tolerance of +/-80ppm over temperature range i.e. +/-35kHz @ 868MHz

Note 7: FSK variation measurement conditions

A frequency modulated signal, carrier = 660kHz with ±35kHz deviation is injected at MIXOUT

Measure the DMDAT voltage swing at 660kHz, this will be DMDAT(Ref) in actual temperature/Vcc conditions

Measure the DMDAT voltage swing from

- Freq[1] = 660kHz - 120kHz to Freq[2] = 660kHz + 120kHz

DMDAT(Ref) / DMDAT(Freq[x]) is measured over the whole range Freq[1] to Freq[2]

ELECTRICAL CHARACTERISTICS

the circuit in recommended in the application schematic (see figure 17), unless otherwise specified. Typical

Parameter

Test Conditions, Comments

Limits

Unit

Min.

Typ.

Max.

Freescale Semiconductor, Inc.

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