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ST92F120 Folha de dados(PDF) 51 Page - STMicroelectronics

Nome de Peças ST92F120
Descrição Electrónicos  8/16-BIT FLASH MCU FAMILY WITH RAM, EEPROM AND J1850 BLPD
PDF  324 Pages
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Fabricante Electrônico  STMICROELECTRONICS [STMicroelectronics]
Página de início  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST92F120 Folha de dados(HTML) 51 Page - STMicroelectronics

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ST92F120 - SINGLE VOLTAGE FLASH & EEPROM
PROTECTION STRATEGY (Cont’d)
Bits 2:0 = PWT[2:0]:
Password Attempt 2-0.
If the TMDIS bit in the NVWPR register (231FFDh)
is programmed to 0, every time a Set Protection
operation is executed with Program Addresses
equal to NVPWD1-0 (231FFE-Fh), the two provid-
ed
Program
Data
are
compared
with
the
NVPWD1-0 content; if there is not a match one of
PWT2-0 bits is automatically programmed to 0:
when these three bits are all programmed to 0 the
test modes are disabled forever. In order to inten-
tionally disable test modes forever, it is sufficient to
set a random Password and then to make 3 wrong
attempts to enter it.
NON VOLATILE WRITE PROTECTION REGIS-
TER (NVWPR)
Address: 231FFDh - Read/Write
Delivery value: 1111 1111 (FFh)
Bit 7 = TMDIS:
Test mode disable (Read Only).
This bit, if set to 1, allows to bypass all the protec-
tions in test and EPB modes. If programmed to 0,
on the contrary, all the protections remain active
also in test mode. The only way to enable the test
modes if this bit is programmed to 0, is to execute
the Set Protection operation with Program Ad-
dresses equal to NVPWD1-0 (231FFF-Eh) and
Program Data matching with the content of
NVPWD1-0. This bit is read only: it is automatically
programmed to 0 when NVPWD1-0 are written for
the first time.
0: Test mode disabled
1: Test mode enabled
Bit 6 = PWOK:
Password OK (Read Only).
If the TMDIS bit is programmed to 0, when the Set
Protection operation is executed with Program Ad-
dresses equal to NVPWD[1:0] and Program Data
matching with NVPWD[1:0] content, the PWOK bit
is automatically programmed to 0. When this bit is
programmed to 0 TMDIS protection is bypassed
and the test and EPB modes are enabled.
0: Password OK
1: Password not OK
Bit 5 = WPBR:
TestFlash Write Protection.
This bit, if programmed at 0, disables any write ac-
cess to the TestFlash address space. This protec-
tion cannot be temporarily disabled.
0: TestFlash write protection on
1: TestFlash write protection off
Note: it is strongly advised to never program the
WPBR bit in the NVWPR register, as this will pre-
vent any further write access to the protection reg-
isters.
Bit 4 = WPEE:
EEPROM Write Protection.
This bit, if programmed to 0, disables any write ac-
cess to the EEPROM address space. This protec-
tion can be temporary disabled by executing the
Set Protection operation and writing 1 into this bit.
To restore the protection it needs to reset the mi-
cro or to execute another Set Protection operation
and write 0 to this bit.
0: EEPROM write protection on
1: EEPROM write protection off
Bits 3:0 = WPRS[3:0]:
ROM Segments 3-0 Write
Protection.
These bits, if programmed to 0, disable any write
access to the 4 Flash sectors address spaces.
These protections can be temporary disabled by
executing the Set Protection operation and writing
1 into these bits. To restore the protection it needs
to reset the micro or to execute another Set Pro-
tection operation and write 0 into these bits.
0: ROM Segments 3-0 write protection on
1: ROM Segments 3-0 write protection off
NON VOLATILE PASSWORD (NVPWD1-0)
Address: 231FFF-231FFEh - Write Only
Delivery value: 1111 1111 (FFh)
Bits 7:0 = PWD[7:0]:
Password bits 7:0 (Write On-
ly).
These bits must be programmed with the Non Vol-
atile Password that must be provided with the Set
Protection operation to disable (first write access)
or to reenable (second write access) the test and
EPB modes. The first write access fixes the pass-
word value and resets the TMDIS bit of NVWPR
7
6
5
4
32
10
TMDI
S
PWO
K
WPB
R
WPE
E
WPRS
3
WPRS
2
WPRS
1
WPRS
0
7
654
321
0
PWD
7
PWD
6
PWD
5
PWD
4
PWD
3
PWD
2
PWD
1
PWD
0
9



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