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TNETX3150A Folha de dados(PDF) 74 Page - Texas Instruments

Nome de Peças TNETX3150A
Descrição Electrónicos  ADDRESS-LOOKUP DEVICE
PDF  78 Pages
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Fabricante Electrônico  TI [Texas Instruments]
Página de início  http://www.ti.com
Logo TI - Texas Instruments

TNETX3150A Folha de dados(HTML) 74 Page - Texas Instruments

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TNETX15AE
ADDRESS-LOOKUP DEVICE
SPWS041A – AUGUST 1997 – REVISED OCTOBER 1997
74
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Outputs are driven to a minimum high-logic level of 2.4 V and to a maximum low-logic level of 0.6 V. These levels
are compatible with TTL devices.
Output transition times are specified as follows: all transition times are measured at the point where the output signal
crosses 1.3 V.
The rise and fall times are not specified but are assumed to be those of standard TTL devices, which are
typically 1.5 ns.
1.3 V
test measurement
The test-load circuit shown in Figure 27 represents the programmable load of the tester pin electronics that is
used to verify timing parameters of the TNETX15VE output signals.
OUTPUT TEST LOAD
CL
IOH
VLOAD
IOL
Test
Point
Output
Under
Test
Where:
IOH
= refer to IOH in recommended operating conditions
IOL
= refer to IOL in recommended operating conditions
VLOAD = 1.5 V, typical
CL
= 25 pF, typical load-circuit capacitance
Figure 27. Test and Load Circuit



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