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TSX561A Folha de dados(PDF) 17 Page - STMicroelectronics

Nome de Peças TSX561A
Descrição Electrónicos  Micropower, wide bandwidth (900 kHz), 16 V CMOS operational amplifiers
PDF  28 Pages
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Fabricante Electrônico  STMICROELECTRONICS [STMicroelectronics]
Página de início  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

TSX561A Folha de dados(HTML) 17 Page - STMicroelectronics

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Application information
DocID023274 Rev 5
17/28
5.4
Long term input offset voltage drift
To evaluate product reliability, two types of stress acceleration are used:
Voltage acceleration, by changing the applied voltage
Temperature acceleration, by changing the die temperature (below the maximum
junction temperature allowed by the technology) with the ambient temperature.
The voltage acceleration has been defined based on JEDEC results, and is defined using
Equation 2.
Equation 2
Where:
AFV is the voltage acceleration factor
β is the voltage acceleration constant in 1/V, constant technology parameter (β = 1)
VS is the stress voltage used for the accelerated test
VU is the voltage used for the application
The temperature acceleration is driven by the Arrhenius model, and is defined in
Equation 3.
Equation 3
Where:
AFT is the temperature acceleration factor
Ea is the activation energy of the technology based on the failure rate
k is the Boltzmann constant (8.6173 x 10-5 eV.K-1)
TU is the temperature of the die when VU is used (K)
TS is the temperature of the die under temperature stress (K)
The final acceleration factor, AF, is the multiplication of the voltage acceleration factor and
the temperature acceleration factor (Equation 4).
Equation 4
AF is calculated using the temperature and voltage defined in the mission profile of the
product. The AF value can then be used in Equation 5 to calculate the number of months of
use equivalent to 1000 hours of reliable stress duration.
Equation 5
A
FV
e
β V
S
V
U
.
=
A
FT
e
E
a
k
------
1
T
U
1
T
S
=
.
A
F
A
FT
A
FV
×
=
Months
A
F
1000 h
×
12 months
24 h
365.25 days
×
×
=
/



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