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STL40C30H3LL Folha de dados(PDF) 10 Page - STMicroelectronics |
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STL40C30H3LL Folha de dados(HTML) 10 Page - STMicroelectronics |
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10 / 19 page ![]() Test circuits for N-channel STL40C30H3LL 10/19 DocID023874 Rev 5 3 Test circuits for N-channel Figure 24. Switching times test circuit for resistive load Figure 25. Gate charge test circuit Figure 26. Test circuit for inductive load switching and diode recovery times Figure 27. Unclamped inductive load test circuit Figure 28. Unclamped inductive waveform Figure 29. Switching time waveform AM01468v1 VGS PW VD RG RL D.U.T. 2200 μF 3.3 μF VDD AM01469v1 VDD 47k Ω 1k Ω 47k Ω 2.7k Ω 1k Ω 12V Vi=20V=VGMAX 2200 μF PW IG=CONST 100 Ω 100nF D.U.T. VG AM01470v1 A D D.U.T. S B G 25 Ω A A B B RG G FAST DIODE D S L=100 μH μF 3.3 1000 μF VDD AM01471v1 Vi Pw VD ID D.U.T. L 2200 μF 3.3 μF VDD AM01472v1 V(BR)DSS VDD VDD VD IDM ID AM01473v1 VDS ton tdon tdoff toff tf tr 90% 10% 10% 0 0 90% 90% 10% VGS |
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