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LP2994M Folha de dados(PDF) 3 Page - National Semiconductor (TI) |
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LP2994M Folha de dados(HTML) 3 Page - National Semiconductor (TI) |
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3 / 15 page ![]() Absolute Maximum Ratings (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. PVIN, AVIN, VTT, VDDQ, SD to GND −0.3V to +6V Storage Temp. Range −65˚C to +150˚C Junction Temperature 150˚C Lead Temperature (Soldering, 10 sec) 260˚C ESD Rating (Note 2) 2kV Operating Range Junction Temp. Range (Note 3) 0˚C to +125˚C AVIN Supply Voltage 2.2V to 5.5V PVIN Supply Voltage -0.3V to (AVIN + 0.3V) SD Input Voltage -0.3V to (AVIN + 0.3V) VTT Output Voltage -0.3V to (PVIN + 0.3V) SO-8 Thermal Resistance ( θ JA) 151˚C/W Electrical Characteristics Specifications with standard typeface are for T J = 25˚C and limits in boldface type apply over the full Operating Temperature Range (T J = 0˚C to +125˚C). Unless otherwise specified, AVIN = PVIN = 2.5V, VDDQ = 2.5V (Note 4). Symbol Parameter Conditions Min Typ Max Units V TT V TT Output Voltage I OUT = 0A (Note 5) VIN=VDDQ = 2.3V 1.108 1.138 1.168 V VIN=VDDQ = 2.5V 1.210 1.236 1.260 VIN=VDDQ = 2.7V 1.305 1.334 1.360 I q Quiescent Current I OUT =0A (Note 6) 272 400 µA Z VDDQ VDDQ Input Impedance 86 100 k Ω I QSD Quiescent current in shutdown 21 45 µA I SD Shutdown Leakage Current SD=0V SD = 2.5V 2 2 5 µA nA V IH Minimum Shutdown High Level 1.9 V V IL Maximum Shutdown Low Level 0.8 V ∆V TT/VTT Load Regulation (Note 7) I OUT = 0 to 1.5A -0.4 % I OUT = 0 to −1.5A +0.4 I SENSE SENSE Input Current 100 pA Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Note 2: The human body model is a 100pF capacitor discharged through a 1.5k Ω resistor into each pin. Note 3: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θJA = 151.2˚ C/W junction to ambient with no heat sink. Note 4: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control (SQC) methods. The limits are used to calculate National’s Average Outgoing Quality Level (AOQL). Note 5: VIN is defined as the VIN = AVIN = PVIN Note 6: Quiescent current defined as the current flow into AVIN. Note 7: Load regulation is tested by using a 10ms current pulse and measuring VTT. www.national.com 3 |
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