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GX1 Folha de dados(PDF) 39 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Nome de Peças GX1
Descrição Electrónicos  Processor Series Low Power Integrated x86 Solution
PDF  247 Pages
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Fabricante Electrônico  NSC [National Semiconductor (TI)]
Página de início  http://www.national.com
Logo NSC - National Semiconductor (TI)

GX1 Folha de dados(HTML) 39 Page - National Semiconductor (TI)

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Signal Definitions (Continued)
2.2.5
Power, Ground, and No Connect Signals
Signal Name
BGA
Pin No.
SPGA
Pin No.
Type
Description
VSS
Refer to
Table 2-3
(Total of
71)
Refer to
Table 2-5
(Total of
50)
GND
Ground Connection
VCC2
Refer to
Table 2-3
(Total of
32)
Refer to
Table 2-5
(Total of
32)
PWR
1.6V, 1.8V, or 2.0V (nominal) Core Power Connection
VCC3
Refer to
Table 2-3
(Total of
32)
Refer to
Table 2-5
(Total of
18)
PWR
3.3V (nominal) I/O Power Connection
NC
AC5
Q5, X2,
Z2,
AM36
No Connection
A line designated as NC must be left disconnected.
2.2.6
Internal Test and Measurement Signals
Signal Name
BGA
Pin No.
SPGA
Pin No.
Type
Description
FLT#
AC2
AJ3
I
Float
Float forces the GX1 processor to float all outputs in the high-
impedance state and to enter a power-down state.
RW_CLK
AE6
AL11
O
Raw Clock
This output is the GX1 processor clock. This debug signal can
be used to verify clock operation.
TEST[3:0]
B22, A23,
B21, C21
D28, B32,
D26, A33
O
SDRAM Test Outputs
These outputs are used for internal debug only.
TCLK
J2
(PU)
P4
(PU)
I
Test Clock
JTAG test clock.
This pin is internally connected to a weak (>20-kohm) pull-up
resistor.
TDI
D2
(PU)
F4
(PU)
I
Test Data Input
JTAG serial test-data input.
This pin is internally connected to a weak (>20-kohm) pull-up
resistor.
TDO
F1
J1
O
Test Data Output
JTAG serial test-data output.
TMS
H1
(PU)
N3
(PU)
I
Test Mode Select
JTAG test-mode select.
This pin is internally connected to a weak (>20-kohm) pull-up
resistor.



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