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SSM3K56CT Folha de dados(PDF) 1 Page - Toshiba Semiconductor

Nome de Peças SSM3K56CT
Descrição Electrónicos  MOSFETs Silicon N-Channel MOS
PDF  8 Pages
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Fabricante Electrônico  TOSHIBA [Toshiba Semiconductor]
Página de início  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

SSM3K56CT Folha de dados(HTML) 1 Page - Toshiba Semiconductor

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SSM3K56CT
1
MOSFETs Silicon N-Channel MOS
SSM3K56CT
SSM3K56CT
SSM3K56CT
SSM3K56CT
Start of commercial production
2013-04
1.
1.
1.
1. Applications
Applications
Applications
Applications
•
High-Speed Switching
2.
2.
2.
2. Features
Features
Features
Features
(1)
1.5-V gate drive voltage.
(2)
Low drain-source on-resistance
: RDS(ON) = 235 mΩ (max) (@VGS = 4.5 V)
RDS(ON) = 300 mΩ (max) (@VGS = 2.5 V)
RDS(ON) = 480 mΩ (max) (@VGS = 1.8 V)
RDS(ON) = 840 mΩ (max) (@VGS = 1.5 V)
3.
3.
3.
3. Packaging and Pin Configuration
Packaging and Pin Configuration
Packaging and Pin Configuration
Packaging and Pin Configuration
CST3
1.Gate
2.Source
3.Drain
4.
4.
4.
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25
))))
Characteristics
Drain-source voltage
Gate-source voltage
Drain current (DC)
Drain current (pulsed)
Power dissipation
Channel temperature
Storage temperature
(Note 1)
(Note 1),(Note 2)
(Note 3)
Symbol
VDSS
VGSS
ID
IDP
PD
Tch
Tstg
Rating
20
±8
800
1600
500
150
-55 to 150
Unit
V
mA
mW
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Ensure that the channel temperature does not exceed 150.
Note 2: Pulse width (PW) ≤ 10 ms, duty ≤ 1%
Note 3: Mounted on an FR4 board.(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2)
2014-04-04
Rev.3.0


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