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LM36274 Folha de dados(PDF) 3 Page - Texas Instruments |
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LM36274 Folha de dados(HTML) 3 Page - Texas Instruments |
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3 / 9 page ![]() 3 LM36274 www.ti.com SNVSAC0A – FEBRUARY 2016 – REVISED FEBRUARY 2016 Product Folder Links: LM36274 Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated 5 Device and Documentation Support 5.1 Device Support 5.1.1 Third-Party Products Disclaimer TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE. 5.1.2 Development Support Power Stage Designer™ tools can be used for the boost calculation: http://www.ti.com/tool/powerstage-designer 5.2 Documentation Support 5.2.1 Related Documentation For related documentation, see the following: • AN-1112 DSBGA Wafer Level Chip Scale Package (SNVA009) • Understanding Boost Power Stages in Switch Mode Power Supplies http://focus.ti.com/lit/an/slva061/slva061.pdf 5.3 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 5.4 Trademarks E2E is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 5.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 5.6 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 6 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. |
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