TLE4966H

Data Sheet

2/11

2003-11-20

Circuit Description

The chopped Double Hall Switch comprises two Hall probes, bias generator,

compensation circuits, oscillator, and output transistors.

The bias generator provides currents for the Hall probes and the active circuits.

Compensation circuits stabilize the temperature behavior and reduce technology

variations.

The Active Error Compensation rejects offsets in signal stages and the influence of

mechanical stress to the Hall probes caused by molding and soldering processes and

other thermal stresses in the package. This chopper technique together with the threshold

generator and the comparator ensures high accurate magnetic switching points.

Figure 1: Block Diagram