LM45 datasheet(3/18 Pages) TI

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LM45

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SNIS117C – AUGUST 1999 – REVISED FEBRUARY 2013

Electrical Characteristics

Unless otherwise noted, these specifications apply for +VS = +5Vdc and ILOAD = +50 μA, in the circuit of Figure 3. These

specifications also apply from +2.5°C to TMAX in the circuit of Figure 2 for +VS = +5Vdc. Boldface limits apply for TA = T J =

TMIN to TMAX ; all other limits TA = TJ = +25°C, unless otherwise noted.

Parameter

Conditions

LM45B

LM45C

Units

(Limit)

Typical

Limit(1)

Typical

Limit(1)

Accuracy(2)

T A=+25°C

±2.0

±3.0

T A=TMAX

±3.0

±4.0

°C (max)

T A=TMIN

±3.0

±4.0

Nonlinearity(3)

T MIN≤TA≤TMAX

±0.8

°C (max)

Sensor Gain (Average Slope)

T MIN≤TA≤TMAX

+9.7

mV/°C (min)

+10.3

mV/°C (max)

Load Regulation(4)

≤I L≤ +1 mA

±35

mV/mA (max)

Line Regulation(4)

+4.0V

≤+V S≤+10V

±0.80

mV/V (max)

±1.2

Quiescent Current(5)

+4.0V

≤+V S≤+10V, +25°C

120

μA (max)

+4.0V

≤+V S≤+10V

160

Change of Quiescent Current(5)

4.0V

≤+V S≤10V

2.0

μA (max)

Temperature Coefficient of

+2.0

μA/°C

Quiescent Current

Minimum Temperature for Rated

In circuit of Figure 2, IL=0

+2.5

°C (min)

Accuracy

Long Term Stability(6)

T J=TMAX, for 1000 hours

±0.12

°C

(1)

Limits are guaranteed to TI's AOQL (Average Outgoing Quality Level).

(2)

Accuracy is defined as the error between the output voltage and 10 mv/°C times the device's case temperature, at specified conditions

of voltage, current, and temperature (expressed in °C).

(3)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's

rated temperature range.

(4)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

(5)

Quiescent current is measured using the circuit of Figure 2.

(6)

For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature

cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered;

allow time for stress relaxation to occur.

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