Push-pull configuration with TDE1708DFT

AN2813

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Doc ID 14923 Rev 1

Figure 14.

Push-pull test configuration schematic

The low-side driver helps to reduce the falling time with the capacitive load, the rest of the

circuit works exactly the same way as that described in Section 2.1. Figure 17 shows a

software timing example in accordance with Table 2 and a dead time between the driver

outputs of 1 µs.