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IO20PDB0V0 Folha de dados(PDF) 51 Page - Microsemi Corporation

Nome de Peças IO20PDB0V0
Descrição Electrónicos  SmartFusion Customizable System-on-Chip (cSoC)
PDF  197 Pages
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Fabricante Electrônico  MICROSEMI [Microsemi Corporation]
Página de início  http://www.microsemi.com
Logo MICROSEMI - Microsemi Corporation

IO20PDB0V0 Folha de dados(HTML) 51 Page - Microsemi Corporation

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SmartFusion Customizable System-on-Chip (cSoC)
Re vi s i on 12
2 - 39
3.3 V PCI, 3.3 V PCI-X
Peripheral Component Interface for 3.3 V standard specifies support for 33 MHz and 66 MHz PCI Bus
applications.
AC loadings are defined per the PCI/PCI-X specifications for the datapath; SoC Products Group loadings
for enable path characterization are described in Figure 2-10.
AC loadings are defined per PCI/PCI-X specifications for the datapath; SoC Products Group loading for
tristate is described in Table 2-60.
Timing Characteristics
Table 2-59 • Minimum and Maximum DC Input and Output Levels
3.3 V PCI/PCI-X
VIL
VIH
VOL
VOH
IOL IOH
IOSL
IOSH
IIL
IIH
Drive Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max.
V
Min.
VmA mA
Max.
mA1
Max.
mA1
µA2 µA2
Per PCI specification
Per PCI curves
15 15
Notes:
1. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
2. Currents are measured at 85°C junction temperature.
Figure 2-10 • AC Loading
Test Point
Enable Path
R to VCCXXXXIOBX for t
LZ / tZL/ tZLS
10 pF for t
ZH / tZHS / tZL / tZLS
10 pF for tHZ / tLZ
R to GND for t
HZ / tZH / tZHS
R = 1 k
Test Point
Datapath
R = 25
R to VCCXXXXIOBX for t
DP (F)
R to GND for t
DP (R)
Table 2-60 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V)
Input High (V)
Measuring Point* (V)
VREF (typ.) (V)
CLOAD (pF)
0
3.3
0.285 * VCCxxxxIOBx for tDP(R)
0.615 * VCCxxxxIOBx for tDP(F)
–10
* Measuring point = Vtrip. See Table 2-22 on page 2-24 for a complete table of trip points.
Table 2-61 • 3.3 V PCI
Worst Commercial-Case Conditions: TJ = 85°C, Worst-Case VCC = 1.425 V,
Worst-Case VCCxxxxIOBx = 3.0 V
Applicable to FPGA I/O Banks, I/O Assigned to EMC I/O Pins
Speed Grade
tDOUT
tDP
tDIN
tPY
tEOUT
tZL
tZH
tLZ
tHZ
tZLS
tZHS
Units
Std.
0.60
2.54
0.04
0.82
0.39
2.58
1.88
3.06
3.39
4.64
3.94
ns
–1
0.50
2.11
0.03
0.68
0.32
2.15
1.57
2.55
2.82
3.87
3.28
ns
Note:
For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values.
Table 2-62 • 3.3 V PCI-X
Worst Commercial-Case Conditions: TJ = 85°C, Worst-Case VCC = 1.425 V,
Worst-Case VCCxxxxIOBx = 3.0 V
Applicable to FPGA I/O Banks, I/O Assigned to EMC I/O Pins
Speed Grade
tDOUT
tDP
tDIN
tPY
tEOUT
tZL
tZH
tLZ
tHZ
tZLS
tZHS
Units
Std.
0.60
2.54
0.04
0.77
0.39
2.58
1.88
3.06
3.39
4.64
3.94
ns
–1
0.50
2.11
0.03
0.64
0.32
2.15
1.57
2.55
2.82
3.87
3.28
ns
Note:
For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values.



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