CDC3RL02

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SCHS371 – NOVEMBER 2009

ABSOLUTE MAXIMUM RATINGS

(1)

over operating free-air temperature range (unless otherwise noted)

MIN

MAX

UNIT

(2)

–0.3

7

V

CLK_REQ_1/2, MCLK_IN

–0.3

V

(2)

–0.3

–50

mA

CLK_REQ_1/2, and MCLK_IN

Continuous output current

CLK_OUT1/2

±20

mA

±50

mA

Human-Body Model

2000

ESD rating

Charged-Device Model

1000

V

Machine Model

200

Operating virtual junction temperature

–40

150

°C

Operating ambient temperature range

–40

85

°C

Storage temperature range

–55

150

°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.

(3)

All voltage values are with respect to network ground terminal.

RECOMMENDED OPERATING CONDITIONS

(1)

MIN

MAX

UNIT

Input voltage

2.3

5.5

V

Input voltage

MCLK_IN, CLK_REQ1/2

0

1.89

V

Output voltage

CLK_OUT1/2

0

1.8

V

High-level input voltage

CLK_REQ1/2

1.3

1.89

V

Low-level input voltage

CLK_REQ1/2

0

0.5

V

High-level output current, DC current

–8

mA

Low-level output current, DC current

8

mA

(1)

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

Copyright © 2009, Texas Instruments Incorporated

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