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MCP6484-E/ST Folha de dados(PDF) 5 Page - Microchip Technology |
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MCP6484-E/ST Folha de dados(HTML) 5 Page - Microchip Technology |
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5 / 50 page ![]() 2012-2013 Microchip Technology Inc. DS20002322C-page 5 MCP6481/2/4 1.3 Test Circuits The circuit used for most DC and AC tests is shown in Figure 1-1. This circuit can independently set VCM and VOUT (refer to Equation 1-1). Note that VCM is not the circuit’s common mode voltage ((VP +VM)/2), and that VOST includes VOS plus the effects (on the input offset error, VOST) of temperature, CMRR, PSRR and AOL. EQUATION 1-1: FIGURE 1-1: AC and DC Test Circuit for Most Specifications. G DM R F RG = V CM V P V DD 2 + 2 = V OUT V DD 2 V P V M – V OST 1G DM + ++ = Where: GDM = Differential Mode Gain (V/V) VCM = Op Amp’s Common Mode Input Voltage (V) VOST = Op Amp’s Total Input Offset Voltage (mV) V OST V IN + V IN– – = VDD RG RF VOUT VM CB2 CL RL VL CB1 100 k 100 k RG RF VDD/2 VP 100 k 100 k 20 pF 10 k 1µF 100 nF VIN– VIN+ CF 6.8 pF CF 6.8 pF MCP648X |
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