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SN65DSI85 Folha de dados(PDF) 21 Page - Texas Instruments |
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SN65DSI85 Folha de dados(HTML) 21 Page - Texas Instruments |
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21 / 45 page ![]() SN65DSI85 www.ti.com SLLSEB9C – SEPTEMBER 2012 – REVISED DECEMBER 2012 ULPS The SN65DSI85 supports the MIPI® defined ultra-low power state (ULPS). While the device is in the ULPS, the CSR registers are accessible via I2C interface. ULPS sequence should be issued to all active DSI CLK and/or DSI data lanes of the enabled DSI Channels for the SN65DSI85 enter the ULPS. The Following sequence should be followed to enter and exit the ULPS. 1. Host issues a ULPS entry sequence to all DSI CLK and data lanes enabled. 2. When host is ready to exit the ULPS mode, host issues a ULPS exit sequence to all DSI CLK and data lanes that need to be active in normal operation. 3. Wait for the PLL_LOCK bit (CSR 0x0A.7) to be set. 4. Set the SOFT_RESET bit (CSR 0x09.0). 5. Device resumes normal operation.(i.e video streaming resumes on the panel). LVDS Pattern Generation The SN65DSI85 supports a pattern generation feature on LVDS Channels. This feature can be used to test the LVDS output path and LVDS panels in a system platform. The pattern generation feature can be enabled by setting the CHA_TEST_PATTERN bit at address 0x3C. No DSI data is received while the pattern generation feature is enabled. There are three modes available for LVDS test pattern generation. The mode of test pattern generation is determined by register configuration as shown in the tables below. Table 2. Test Pattern Generation Test pattern generation mode Register configurations LVDS_LINK_CFG(CSR 0x18.4) = 1b DSI_CH_MODE(CSR 0x10.6:5) = XXb Single LVDS configuration mode CHA_TEST_PATTERN(CSR 0x3C.4) = 1b CHB_TEST_PATTERN(CSR 0x3C.0) = 0b LVDS_LINK_CFG(CSR 0x18.4) = 0b DSI_CH_MODE(CSR 0x10.6:5) = 0Xb Dual LVDS configuration mode CHA_TEST_PATTERN(CSR 0x3C.4) = 1b CHB_TEST_PATTERN(CSR 0x3C.0) = 0b LVDS_LINK_CFG(CSR 0x18.4) = 0b Two independent LVDS configuration DSI_CH_MODE(CSR 0x10.6:5) = 10b mode CHA_TEST_PATTERN(CSR 0x3C.4) = 1b CHB_TEST_PATTERN(CSR 0x3C.0) = 1b The following tables shows a list of video registers that need to be configured for test pattern generation video parameters. 1. Single LVDS configuration Table 3. Video Registers Addr. bit Register Name 0x20.7:0 CHA_ACTIVE_LINE_LENGTH_LOW 0x21.3:0 CHA_ACTIVE_LINE_LENGTH_HIGH 0x24.7:0 CHA_VERTICAL_DISPLAY_SIZE_LOW 0x25.3:0 CHA_VERTICAL_DISPLAY_SIZE_HIGH 0x2C.7:0 CHA_HSYNC_PULSE_WIDTH_LOW 0x2D.1:0 CHA_HSYNC_PULSE_WIDTH_HIGH 0x30.7:0 CHA_VSYNC_PULSE_WIDTH_LOW 0x31.1:0 CHA_VSYNC_PULSE_WIDTH_HIGH 0x34.7:0 CHA_HORIZONTAL_BACK_PORCH 0x36.7:0 CHA_VERTICAL_BACK_PORCH 0x38.7:0 CHA_HORIZONTAL_FRONT_PORCH 0x3A.7:0 CHA_VERTICAL_FRONT_PORCH Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 21 Product Folder Links: SN65DSI85 |
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