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SN65DSI85 Folha de dados(PDF) 21 Page - Texas Instruments

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Nome de Peças SN65DSI85
Descrição Electrónicos  MIPI DSI BRIDGE TO FLATLINK LVDS Dual Channel DSI to Dual-Link LVDS Bridge
PDF  45 Pages
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Fabricante Electrônico  TI [Texas Instruments]
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SN65DSI85 Folha de dados(HTML) 21 Page - Texas Instruments

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SN65DSI85
www.ti.com
SLLSEB9C – SEPTEMBER 2012 – REVISED DECEMBER 2012
ULPS
The SN65DSI85 supports the MIPI® defined ultra-low power state (ULPS). While the device is in the ULPS, the
CSR registers are accessible via I2C interface. ULPS sequence should be issued to all active DSI CLK and/or
DSI data lanes of the enabled DSI Channels for the SN65DSI85 enter the ULPS. The Following sequence should
be followed to enter and exit the ULPS.
1. Host issues a ULPS entry sequence to all DSI CLK and data lanes enabled.
2. When host is ready to exit the ULPS mode, host issues a ULPS exit sequence to all DSI CLK and data lanes
that need to be active in normal operation.
3. Wait for the PLL_LOCK bit (CSR 0x0A.7) to be set.
4. Set the SOFT_RESET bit (CSR 0x09.0).
5. Device resumes normal operation.(i.e video streaming resumes on the panel).
LVDS Pattern Generation
The SN65DSI85 supports a pattern generation feature on LVDS Channels. This feature can be used to test the
LVDS output path and LVDS panels in a system platform. The pattern generation feature can be enabled by
setting the CHA_TEST_PATTERN bit at address 0x3C. No DSI data is received while the pattern generation
feature is enabled.
There are three modes available for LVDS test pattern generation. The mode of test pattern generation is
determined by register configuration as shown in the tables below.
Table 2. Test Pattern Generation
Test pattern generation mode
Register configurations
LVDS_LINK_CFG(CSR 0x18.4) = 1b
DSI_CH_MODE(CSR 0x10.6:5) = XXb
Single LVDS configuration mode
CHA_TEST_PATTERN(CSR 0x3C.4) = 1b
CHB_TEST_PATTERN(CSR 0x3C.0) = 0b
LVDS_LINK_CFG(CSR 0x18.4) = 0b
DSI_CH_MODE(CSR 0x10.6:5) = 0Xb
Dual LVDS configuration mode
CHA_TEST_PATTERN(CSR 0x3C.4) = 1b
CHB_TEST_PATTERN(CSR 0x3C.0) = 0b
LVDS_LINK_CFG(CSR 0x18.4) = 0b
Two independent LVDS configuration
DSI_CH_MODE(CSR 0x10.6:5) = 10b
mode
CHA_TEST_PATTERN(CSR 0x3C.4) = 1b
CHB_TEST_PATTERN(CSR 0x3C.0) = 1b
The following tables shows a list of video registers that need to be configured for test pattern generation video
parameters.
1. Single LVDS configuration
Table 3. Video Registers
Addr. bit
Register Name
0x20.7:0
CHA_ACTIVE_LINE_LENGTH_LOW
0x21.3:0
CHA_ACTIVE_LINE_LENGTH_HIGH
0x24.7:0
CHA_VERTICAL_DISPLAY_SIZE_LOW
0x25.3:0
CHA_VERTICAL_DISPLAY_SIZE_HIGH
0x2C.7:0
CHA_HSYNC_PULSE_WIDTH_LOW
0x2D.1:0
CHA_HSYNC_PULSE_WIDTH_HIGH
0x30.7:0
CHA_VSYNC_PULSE_WIDTH_LOW
0x31.1:0
CHA_VSYNC_PULSE_WIDTH_HIGH
0x34.7:0
CHA_HORIZONTAL_BACK_PORCH
0x36.7:0
CHA_VERTICAL_BACK_PORCH
0x38.7:0
CHA_HORIZONTAL_FRONT_PORCH
0x3A.7:0
CHA_VERTICAL_FRONT_PORCH
Copyright © 2012, Texas Instruments Incorporated
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