ADM488/ADM489

–3–

REV. 0

ABSOLUTE MAXIMUM RATINGS*

Inputs

Control Inputs (DE,

RE) . . . . . . . . . –0.3 V to V

Receiver Inputs (A, B) . . . . . . . . . . . . . . . . –14 V to +14 V

Outputs

Driver Outputs . . . . . . . . . . . . . . . . . . . . . –14 V to +12.5 V

Power Dissipation 8-Lead DIP . . . . . . . . . . . . . . . . . 700 mW

θ

. . . . . . . . . . . . . . . . . . . 120

°C/W

Power Dissipation 8-Lead SOIC . . . . . . . . . . . . . . . . 520 mW

θ

. . . . . . . . . . . . . . . . . . . 110

°C/W

Power Dissipation 14-Lead DIP . . . . . . . . . . . . . . . . 800 mW

θ

. . . . . . . . . . . . . . . . . . . 140

°C/W

Power Dissipation 14-Lead SOIC . . . . . . . . . . . . . . . 800 mW

θ

. . . . . . . . . . . . . . . . . . . 120

°C/W

ORDERING GUIDE

Model

Temperature Range

Package Description

Package Option

ADM488AR

–40

°C to +85°C

8-Lead Narrow Body (SOIC)

SO-8

ADM488AN

–40

°C to +85°C

8-Lead Plastic DIP

N-8

ADM489AN

–40

°C to +85°C

14-Lead Plastic DIP (Narrow)

N-14

ADM489AR

–40

°C to +85°C

14-Lead Narrow Body (SOIC)

R-14

ADM489ARU

–40

°C to +85°C

16-Lead Thin Shrink Small Outline Package (TSSOP)

RU-16

Power Dissipation 16-Lead TSSOP . . . . . . . . . . . . . . 800 mW

θ

. . . . . . . . . . . . . . . . . . . 150

°C/W

Operating Temperature Range

Industrial (A Version) . . . . . . . . . . . . . . . –40

°C to +85°C

Storage Temperature Range . . . . . . . . . . . . –65

°C to +150°C

Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300

°C

Vapor Phase (60 secs) . . . . . . . . . . . . . . . . . . . . . . +215

°C

Infrared (15 secs) . . . . . . . . . . . . . . . . . . . . . . . . . . . +220

°C

ESD Rating, MIL-STD-883B . . . . . . . . . . . . . . . . . . . . . 4 kV

EFT Rating, IEC1000-4-4 . . . . . . . . . . . . . . . . . . . . . . . 2 kV

*Stresses above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device. This is a stress rating only; functional operation of the

device at these or any other conditions above those listed in the operational

sections of this specification is not implied. Exposure to absolute maximum ratings

for extended periods of time may affect device reliability.