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SP385ECA Folha de dados(PDF) 7 Page - Sipex Corporation |
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SP385ECA Folha de dados(HTML) 7 Page - Sipex Corporation |
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7 / 11 page ![]() Rev. 10/22/01 SP385E Enhanced +3V to +5V RS-232 Line Driver/Receiver © Copyright 2001 Sipex Corporation 7 Shutdown (ON/OFF) The SP385E has a shut-down/standby mode to conserve power in battery-powered systems. To activate the shutdown mode, which stops the operation of the charge pump, a logic "0" is applied to the appropriate control line. The shutdown mode is controlled on the SP385E by a logic "0" on the ON/OFF control line (pin 18 for the SOIC and pin 20 for the SSOP packages); this puts the transmitter outputs in a tri-state mode. ESD Tolerance The SP385E device incorporates ruggedized ESD cells on all driver output and receiver input pins. The ESD structure is improved over our previous family for more rugged applications and environments sensitive to electro-static discharges and associated transients. The improved ESD tolerance is at least ±15KV with- out damage nor latch-up. There are different methods of ESD testing applied: a) MIL-STD-883, Method 3015.7 b) IEC1000-4-2 Air-Discharge c) IEC1000-4-2 Direct Contact The Human Body Model has been the generally accepted ESD testing method for semiconductors. This method is also specified in MIL-STD-883, Method 3015.7 for ESD testing. The premise of this ESD test is to simulate the human body’s potential to store electro-static energy and discharge it to an integrated circuit. The simulation is performed by using a test model as shown in Figure 6. This method will test the IC’s capability to withstand an ESD transient during normal handling such as in manufacturing areas where the ICs tend to be handled frequently. The IEC-1000-4-2, formerly IEC801-2, is generally used for testing ESD on equipment and systems. For system manufacturers, they must guarantee a certain amount of ESD protection since the system itself is exposed to the outside environment and human presence. The premise with IEC1000-4-2 is that the system is required to withstand an amount of static electricity when ESD is applied to points and surfaces of the equipment that are accessible to personnel during normal usage. The transceiver IC receives most of the ESD current when the ESD source is applied to the connector pins. The test circuit for IEC1000-4-2 is shown on Figure 7. There are two methods within IEC1000-4-2, the Air Discharge method and the Contact Discharge method. Figure 4. Charge Pump — Phase 3 VCC = +5V –5V +5V –5V VSS Storage Capacitor VDD Storage Capacitor C1 C2 C3 C4 + + ++ – – – – Figure 5. Charge Pump — Phase 4 VCC = +5V +10V VSS Storage Capacitor VDD Storage Capacitor C1 C2 C3 C4 + + ++ – – – – Figure 6. ESD Test Circuit for Human Body Model R RC C C CSS R RSS SW1 SW1 SW2 SW2 RC Device Under Test DC Power Source CS RS SW1 SW2 Figure 7. ESD Test Circuit for IEC1000-4-2 R RS S and and R RV V add up to 330 add up to 330 Ω Ω ffor IEC1000-4-2. or IEC1000-4-2. RS and RV add up to 330Ω for IEC1000-4-2. Contact-Discharge Module Contact-Discharge Module R RVV R RC C C CSS R RSS SW1 SW1 SW2 SW2 RC Device Under Test DC Power Source CS RS SW1 SW2 RV Contact-Discharge Module |
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