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74LVC1G74 Folha de dados(PDF) 13 Page - NXP Semiconductors

Nome de Peças 74LVC1G74
Descrição Electrónicos  Single D-type flip-flop with set and reset; positive edge trigger
PDF  25 Pages
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Fabricante Electrônico  PHILIPS [NXP Semiconductors]
Página de início  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LVC1G74 Folha de dados(HTML) 13 Page - NXP Semiconductors

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74LVC1G74
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 10 — 2 December 2011
13 of 25
NXP Semiconductors
74LVC1G74
Single D-type flip-flop with set and reset; positive edge trigger
Test data is given in Table 11.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 10. Test circuit for measuring switching times
VEXT
VCC
VI
VO
mna616
DUT
CL
RT
RL
RL
G
Table 11.
Test data
Supply voltage
Input
Load
VEXT
VCC
VI
tr, tf
CL
RL
tPLH, tPHL
tPZH, tPHZ
tPZL, tPLZ
1.65 V to 1.95 V
VCC
 2.0ns
30pF
1k
open
GND
2VCC
2.3 V to 2.7 V
VCC
 2.0 ns
30 pF
500
open
GND
2VCC
2.7 V
2.7 V
 2.5 ns
50 pF
500
open
GND
6 V
3.0 V to 3.6 V
2.7 V
 2.5 ns
50 pF
500
open
GND
6 V
4.5 V to 5.5 V
VCC
 2.5 ns
50 pF
500
open
GND
2VCC



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