D2003 datasheet(2/4 Pages) SEME-LAB

2 / 4 page

D2003UK

Prelim.01/01

Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.

E-mail: sales@semelab.co.uk

Website: http://www.semelab.co.uk

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

0.18

20:1

0.5

VGS = 0

ID = 10mA

VDS = 28V

VGS = 0

VGS = 20V

VDS = 0

ID = 10mA

VDS = VGS

VDS = 10V

ID = 1A

PO = 5W

VDS = 28V

IDQ = 0.2A

f = 1GHz

VDS = 28V

VGS = –5V f = 1MHz

VDS = 28V

VGS = 0

f = 1MHz

VDS = 28V

VGS = 0

f = 1MHz

—

ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)

Drain–Source Breakdown

Voltage

Zero Gate Voltage

Drain Current

Gate Leakage Current

Gate Threshold Voltage*

Forward Transconductance*

Common Source Power Gain

Drain Efficiency

Load Mismatch Tolerance

Input Capacitance

Output Capacitance

Reverse Transfer Capacitance

HAZARDOUS MATERIAL WARNING

The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly

toxic and care must be taken during handling and mounting to avoid damage to this area.

THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.

RTHj–case

Thermal Resistance Junction – Case

Max. 5.0°C / W

THERMAL DATA

* Pulse Test:

Pulse Duration = 300

ms , Duty Cycle £ 2%

TOTAL DEVICE

PER SIDE

BVDSS

IDSS

IGSS

VGS(th)

gfs

GPS

VSWR

Ciss

Coss

Crss

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