Os motores de busca de Datasheet de Componentes eletrônicos
  Portuguese  ▼
ALLDATASHEETPT.COM

X  

LSEG35162-R1 Folha de dados(PDF) 6 Page - LIGITEK electronics co., ltd.

Nome de Peças LSEG35162-R1
Descrição Electrónicos  BIPOLAR TYPE LED LAMPS
PDF  6 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrônico  LIGITEK [LIGITEK electronics co., ltd.]
Página de início  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LSEG35162-R1 Folha de dados(HTML) 6 Page - LIGITEK electronics co., ltd.

  LSEG35162-R1 Datasheet HTML 1Page - LIGITEK electronics co., ltd. LSEG35162-R1 Datasheet HTML 2Page - LIGITEK electronics co., ltd. LSEG35162-R1 Datasheet HTML 3Page - LIGITEK electronics co., ltd. LSEG35162-R1 Datasheet HTML 4Page - LIGITEK electronics co., ltd. LSEG35162-R1 Datasheet HTML 5Page - LIGITEK electronics co., ltd. LSEG35162-R1 Datasheet HTML 6Page - LIGITEK electronics co., ltd.  
Zoom Inzoom in Zoom Outzoom out
 6 / 6 page
background image
The purpose of this test is the resistance
of the device under tropical for hous.
This test intended to see soldering well
performed or not.
1.T.Sol=260 ℃±5
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solderability Test
1.T.Sol=230 ℃±5
2.Dwell time=5 ±1sec
Thermal Shock Test
High Temperature
High Humidity Test
Solder Resistance
Test
1.Ta=105 ℃±5&-40℃±5
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
1.Ta=65 ℃±5
2.RH=90 %~95%
3.t=240hrs ±2hrs
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202:103B
JIS C 7021: B-11
Page 5/5
PART NO. LSEG35162/R1
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
Operating Life Test
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
High Temperature
Storage Test
Low Temperature
Storage Test
The purpose of this is the resistance of
the device which is laid under ondition
of hogh temperature for hours.
1.Ta=-40 ℃±5
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
1.Ta=105 ℃±5
2.t=1000 hrs (-24hrs, +72hrs)
Reliability Test:
Test Item
Test Condition
Description
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
JIS C 7021: B-12
MIL-STD-883:1008
JIS C 7021: B-10
Reference
Standard
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only



Html Pages

1 2 3 4 5 6


Folha de dados Download

Go To PDF Page


Ligação URL



ALLDATASHEET é útil para você?  [ DONATE ] 

Sobre Alldatasheet   |   Publicidade   |   Contato conosco   |   Privacy Policy   |   Link para a ficha técnica    |   roca de Link   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com