UVEPROM

UVEPROM

UVEPROM

UVEPROM

UVEPROM

AS27C256

AS27C256

Rev. 2.0 7/06

Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.

7

Austin Semiconductor, Inc.

NOTES:

1.Timing measurements are made at 2V for logic high and 0.8V for logic low (see figure 2).

2. Common test conditions apply for t

dis

except during programming.

3. Value calculated from 0.5V delta to measured output level. This parameter is only sampled and not 100% tested.

SWITCHING CHARACTERISTICS FOR PROGRAMMING: V

FLASHRITE ALGO), T

CAPACITANCE OVER RECOMMENDED RANGES OF SUPPLY VOLTAGE AND OPERAT-

ING FREE-AIR TEMPERATURE, f = 1MHz*

* Capacitance measurements are made on a sample basis only.

** Typical values are at T

A

= 25°C and nominal voltages.

SWITCHING CHARACTERISTICS OVER RECOMMENDED RANGES OF SUPPLY VOLT-

TEST CONDITIONS

TYP**

MAX

UNIT

Input capacitance

610

pF

Output capacitance

10

14

pF

PARAMETER

MIN MAX MIN MAX

Access time from address

120

150

ns

Access time from E\

120

150

ns

40

50

ns

Disable time of output from G\ or E\,

whichever occurs first

3

0

30

0

30

ns

Output data valid time after change of

address, E\, or G\, whichever occurs first

3

00

ns

PARAMETER

-12

see Figure 2

-15

UNIT

TEST

CONDITIONS

1, 2

MIN MAX MIN MAX MIN MAX

Access time from address

170

200

250

ns

Access time from E\

170

200

250

ns

50

60

60

ns

Disable time of output from G\ or E\,

whichever occurs first

3

040

0

50

060

ns

Output data valid time after change of

address, E\, or G\, whichever occurs first

3

000

ns

see Figure 2

-25

UNIT

TEST

CONDITIONS

1, 2

PARAMETER

-17

-20

MIN

MAX

UNIT

0

130

ns

150

ns

PARAMETER