Temp

MIL-STD-202G Method 108A

Time

T

More than 95% of termincal electrode should

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NOTE : Specifications subject to change without notice. Please check our website for latest information.

MIL-STD-202G Method 208H

Physical Characteristics Tests

Reference documents:

IPC J-STD-002B

Solderability Test

be covered with solder.

PG. 4

31.07.2008

Solder : Sn(63)/Pb(37)

Flux : rosin flux

Dip time : 5 secs.

Solder temperature : 245±5°C

-40°C

1. No case deformation or change in appearance.

1. No case deformation or change in appearance.

1. No case deformation or change in appearance.

Reference documents:

MIL-STD-202G Method 107G

Thermal shock test

Reference documents:

4. DCR/DCR<10%

T : weight< 28g : 15 Min.

28g<weight<136g : 30 Min.

2. L/L<30% (Closed Magnetic Circuit)

3. Q/Q < 30%

L/L<10%

MIL-STD-202G Method 103B

4. DCR/DCR<10%

3. Q/Q < 30%

3. Q/Q < 30%

Humidity Test

IEC 68-2-1A 6.1 6.2

2. L/L<30% (Closed Magnetic Circuit)

L/L<10%

4. DCR/DCR<10%

Low Temperature Storage Test

Reference documents:

2. L/L<30% (Closed Magnetic Circuit)

L/L<10%

4. DCR/DCR<10%

Change time < 5 min

Room

Temp

0

Temp

125°C

Conditions of 1 cycle :

Step 2 : 125°C for T time

Step 1 : -40°C for T time

Total : 20 cycles

T

Tested after 1 hour (less than 2 hours) at room temperature

Tested while the specimens are still in the chamber

96H

High temperature

93%RH

0

High humidity

Time : 96±2 hours

Temp & Humidity

40°C

Conditions

1H

Test Time

Room

Dry oven at temperature of 40±5°C for 24 hours

Exposure : Temperature : 40±2°C, Humidity : 93±3% RH,

Temp

Measured after 24 hours

Low temperature

0

-25°C

Room

Temp

96H

Test

Time

96H

Tested after 1 hour (less than 2 hours) at room temperature

Temperature : -25±2°C

Time : 96±2 hours

Room

0

Temp

High temperature

85°C

Test

1H

Time

1. No case deformation or change in appearance.

High Temperature Storage Test

6. RELIABILITY AND TEST CONDITION :

Reference documents:

Environmental Tests

ITEM

2. L/L<30% (Closed Magnetic Circuit)

L/L<10%

3. Q/Q < 30%

PERFORMANCE

Tested after 1 hour (less than 2 hours) at room temperature

TEST CONDITION

Temperature : 85±2°C

Time : 96±2 hours

WIREWOUND CHIP INDUCTORS

SDI322520 SERIES