CY74FCT16543T

CY74FCT162543T

CY74FCT162H543T

3

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

−0.7

−1.2

V

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

High Impedance Output Cur-

rent (Three-State Output pins)

±1

µA

High Impedance Output Cur-

rent (Three-State Output pins)

±1

µA

−80

−140

−200

mA

−50

−180

mA

Power-Off Disable

[8]

±1

µA

Notes:

1.

A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA, and OEBA.

2.

Data prior to LEAB LOW-to-HIGH Transition

H = HIGH Voltage Level. L = LOW Voltage Level.

X = Don’t Care. Z = High Impedance.

3.

Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature

range.

4.

5.

6.

This parameter is specified but not tested.

7.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

8.

Tested at +25˚C.

9.

On the 74FCT162H543T, these pins have bus hold.