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M66290AFP Folha de dados(PDF) 52 Page - Renesas Technology Corp |
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M66290AFP Folha de dados(HTML) 52 Page - Renesas Technology Corp |
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52 / 54 page ![]() USB DEVICE CONTROLLER M66290AGP/FP MITSUBISHI <DIGITAL ASSP> 51 11 9 8 Boundary scan register (JTAGBSR) By pass register (JTAGBPR) ID code register (JTAGIDR) Decoder Command register (3bits) (JTAGIR) TAP controller Data register group TDI TMS TCK TRST 10 12 TDO M66290A Abstraction of JTAG M66290A has JTAG (Joint Test Action Group) interf ace which meets IEEE 1149.1 test access port spec. This JTAG interf ace can be used f or input/output path (boundary scan path) f or boundary scan test. Further inf ormation as to JTAG test access port, ref er to "IEEE Std. 1149.1a-1993". Pin descriptions Pin description which relates to JTAG interf ace of M66290A are as f ollows. Test clock input (TCK) Clock input into test circuit. Test data input (TDI) Sy nchronous serial input to input test command code and test data. Data is sampled by the positiv e edge of TCK. Test data output (TDO) Sy nchronous serial output to output test command code and test data. Output data changes by the negativ e edge of TCK and is output only in the state of Shif t-IR or Shif t-DR. In other state,keeps "Z". Test mode input (TMS) Test mode select input to control status shif t of test circuit. This is sampled by the positiv e edge of TCK. Test reset input (TRST) "L" activ e test reset input to initialize the test circuit asy nchronously . To assure this reset f unction, keep TMS input as "H" when this signal changes f rom "L" to "H". JTAG circuit constitution JTAG circuit of M66290A is constituted by the blocks as f ollows. (1) Command register which keeps command code which is f etched through the boundary scan path. (2) Data register group which is accessed through the boundary scan pass. (3) Test access port (TAP) controller to control the status shif t of JTAG block. (4) Control logic f or input select, output select, and so. |
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