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SN74AUC1G79 Folha de dados(PDF) 2 Page - Texas Instruments

Nome de Peças SN74AUC1G79
Descrição Electrónicos  SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP
PDF  12 Pages
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Fabricante Electrônico  TI [Texas Instruments]
Página de início  http://www.ti.com
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SN74AUC1G79 Folha de dados(HTML) 2 Page - Texas Instruments

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DESCRIPTION/ORDERING INFORMATION (CONTINUED)
D
CLK
Q
CLK
D
Q
Absolute Maximum Ratings
(1)
SN74AUC1G79
SINGLE POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP
SCES387K – MARCH 2002 – REVISED APRIL 2007
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
FUNCTION TABLE
INPUTS
OUTPUT
Q
CLK
D
H
H
L
L
L
X
Q0
LOGIC DIAGRAM (POSITIVE LOGIC)
over operating free-air temperature range (unless otherwise noted)
MIN
MAX
UNIT
VCC
Supply voltage range
–0.5
3.6
V
VI
Input voltage range(2)
–0.5
3.6
V
VO
Voltage range applied to any output in the high-impedance or power-off state(2)
–0.5
3.6
V
VO
Output voltage range(2)
–0.5
VCC + 0.5
V
IIK
Input clamp current
VI < 0
–50
mA
IOK
Output clamp current
VO < 0
–50
mA
IO
Continuous output current
±20
mA
Continuous current through VCC or GND
±100
mA
DBV package
206
DCK package
252
θ
JA
Package thermal impedance(3)
°C/W
DRY package
234
YZP package
132
Tstg
Storage temperature range
–65
150
°C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3)
The package thermal impedance is calculated in accordance with JESD 51-7.
2
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