74HC_HCT259

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© NXP Semiconductors N.V. 2016. All rights reserved.

Product data sheet

Rev. 6 — 2 February 2016

13 of 21

NXP Semiconductors

74HC259; 74HCT259

8-bit addressable latch

Test data is given in Table 10.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch

Fig 12. Test circuit for measuring switching times

Table 10.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPHL, tPLH

74HC259

VCC

6ns

15pF, 50 pF

1k



open

74HCT259

3V

6ns

15pF, 50 pF

1k



open