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APM32F103TBU7-R Folha de dados(PDF) 55 Page - Geehy Semiconductor Co., Ltd.

Nome de Peças APM32F103TBU7-R
Descrição Electrónicos  Arm® Cortex® -M3 based 32-bit MCU
PDF  78 Pages
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Fabricante Electrônico  GEEHY [Geehy Semiconductor Co., Ltd.]
Página de início  https://global.geehy.com/
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APM32F103TBU7-R Folha de dados(HTML) 55 Page - Geehy Semiconductor Co., Ltd.

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P a g e 54
Symbol
Parameter
Condition
Minimum
value
Typical
value
Maximum
value
Unit
VREFINT(1)
Built-in Reference Voltage
-40℃ < TA < +125℃
VDD= 2-3.6 V
1.16
1.21
1.26
V
TS_vrefint(2)
Sampling time of ADC
when reading out internal
reference voltage
-
-
5.1
17.1
μs
VREFINT
Change of built-in
reference voltage value in
the full temperature range
VDD=3V±10mV
-
-
10
mV
TCoeff
-
-
-
-
126
ppm/
℃
1.
The data are obtained from a comprehensive evaluation and are not tested in production.
2.
Guaranteed by design and not tested in production.
5.13
Temperature sensor characteristics
Table45 Temperature Sensor Characteristics
Symbol
Parameter
Minimum
value
Typical
value
Maximum
value
Unit
Avg_Slope(1)
Average slope (VDD = 3.3V, TA = -40~105
℃)
2.7
3.6
3.9
mV/ºC
V25
Voltage at 25ºC (VDD = 2.0-3.6V)
1.38
1.41
1.45
V
tSTART(2)
Setup time
4
-
10
μs
TS_temp(2)(3)
ADC sampling time when reading the
temperature
-
-
17.1
μs
1.
Guaranteed by characteristic analysis and not tested in production.
2.
Guaranteed by design and not tested in production.
3.
The minimum sampling time can be determined by multiple loops in the application.



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